Patents by Inventor Walter Augustyn

Walter Augustyn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070146674
    Abstract: A system for microlithography comprises an illumination source; an illumination optical system including, in order from an objective side, (a) a first diffractive optical element that receives illumination from the illumination source, (b) a zoom lens, (c) a second diffractive optical element, (d) a condenser lens, (e) a relay lens, and (f) a reticle, and a projection optical system for imaging the reticle onto a substrate, wherein the system for microlithography provides a zoomable numerical aperture.
    Type: Application
    Filed: March 6, 2007
    Publication date: June 28, 2007
    Applicant: ASML Holding N.V.
    Inventors: Mark Oskotsky, Lev Ryzhikov, Scott Coston, James Tsacoyeanes, Walter Augustyn
  • Patent number: 7187430
    Abstract: A system for microlithography comprises an illumination source; an illumination optical system including, in order from an objective side, (a) a first diffractive optical element that receives illumination from the illumination source, (b) a zoom lens, (c) a second diffractive optical element, (d) a condenser lens, (e) a relay lens, and (f) a reticle, and a projection optical system for imaging the reticle onto a substrate, wherein the system for microlithography provides a zoomable numerical aperture.
    Type: Grant
    Filed: July 22, 2004
    Date of Patent: March 6, 2007
    Assignee: ASML Holding N.V.
    Inventors: Mark Oskotsky, Lev Ryzhikov, Scott Coston, James Tsacoyeanes, Walter Augustyn
  • Publication number: 20060115956
    Abstract: A system and method are used to increase alignment accuracy of feature patterns through detection of alignment patterns on both a surface layer and at least one below surface layers of an object. Visible light is used to detect alignment patterns on the surface layer and infrared light is used to detect patterns one layers below the surface. For example, reflected visible light and transmitted infrared light are co-focused onto detector after impinging on respective alignment patterns. The co-focused light is then used to determine proper alignment of the object for subsequent pattern features. This substantially increases accuracy of alignment of pattern features between layers, as compared to conventional systems.
    Type: Application
    Filed: November 15, 2005
    Publication date: June 1, 2006
    Applicant: ASML Holding N.V.
    Inventors: Pankaj Raval, Walter Augustyn
  • Patent number: 7006198
    Abstract: The present invention relates to a method and system for expanding a laser beam. An illumination system includes a horizontal reflective multiplexer and a vertical reflective multiplexer. The horizontal reflective multiplexer replicates the input beam along a first dimension to form a first multiplexed beam. The vertical reflective multiplexer replicates the first multiplexed beam along a second dimension to form a second multiplexed beam. In one example, the horizontal reflective multiplexer includes a first beam splitter, second beam splitter, and mirror. The vertical reflective multiplexer includes a beam splitter and mirror.
    Type: Grant
    Filed: October 22, 2004
    Date of Patent: February 28, 2006
    Assignee: ASML Holding N.V.
    Inventors: Walter Augustyn, James Tsacoyeanes
  • Publication number: 20050248743
    Abstract: An electromagnetic radiation diffuser, operative at extreme ultraviolet (EUV) wavelengths, is fabricated on a substrate. The diffuser comprises a randomized structure having a peak and valley profile over which a highly reflective coating is formed. The reflective coating substantially takes the form of the peak and valley profile beneath it. An absorptive grating can be fabricated over the reflective coating. The grating spaces will diffusely reflect electromagnetic radiation because of the profile of the randomized structure beneath. The absorptive grating will absorb the electromagnetic radiation. The grating thus becomes a specialized Ronchi ruling that may be used for wavefront evaluation and other optical diagnostics in extremely short wavelength reflective lithography systems, such as EUV lithography systems.
    Type: Application
    Filed: July 19, 2005
    Publication date: November 10, 2005
    Applicant: ASML Holding N.V.
    Inventors: Walter Augustyn, Richard Gontin
  • Publication number: 20050083505
    Abstract: The present invention relates to a method and system for expanding a laser beam. An illumination system includes a horizontal reflective multiplexer and a vertical reflective multiplexer. The horizontal reflective multiplexer replicates the input beam along a first dimension to form a first multiplexed beam. The vertical reflective multiplexer replicates the first multiplexed beam along a second dimension to form a second multiplexed beam. In one example, the horizontal reflective multiplexer includes a first beam splitter, second beam splitter, and mirror. The vertical reflective multiplexer includes a beam splitter and mirror.
    Type: Application
    Filed: October 22, 2004
    Publication date: April 21, 2005
    Inventors: Walter Augustyn, James Tsacoyeanes
  • Publication number: 20040263821
    Abstract: A system for microlithography comprises an illumination source; an illumination optical system including, in order from an objective side, (a) a first diffractive optical element that receives illumination from the illumination source, (b) a zoom lens, (c) a second diffractive optical element, (d) a condenser lens, (e) a relay lens, and (f) a reticle, and a projection optical system for imaging the reticle onto a substrate, wherein the system for microlithography provides a zoomable numerical aperture.
    Type: Application
    Filed: July 22, 2004
    Publication date: December 30, 2004
    Applicant: ASML Holding N.V.
    Inventors: Mark Oskotsky, Lev Ryzhikov, Scott Coston, James Tsacoyeanes, Walter Augustyn
  • Patent number: 6819402
    Abstract: The present invention relates to a method and system for expanding a laser beam. An illumination system includes a horizontal reflective multiplexer and a vertical reflective multiplexer. The horizontal reflective multiplexer replicates the input beam along a first dimension to form a first multiplexed beam. The vertical reflective multiplexer replicates the first multiplexed beam along a second dimension to form a second multiplexed beam. In one example, the horizontal reflective multiplexer includes a first beam splitter, second beam splitter, and mirror. The vertical reflective multiplexer includes a beam splitter and mirror.
    Type: Grant
    Filed: October 16, 2002
    Date of Patent: November 16, 2004
    Assignee: ASML Holding N.V.
    Inventors: Walter Augustyn, James Tsacoyeanes
  • Patent number: 6813003
    Abstract: A system for microlithography comprises an illumination source; an illumination optical system including, in order from an objective side, (a) a first diffractive optical element that receives illumination from the illumination source, (b) a zoom lens, (c) a second diffractive optical element, (d) a condenser lens, (e) a relay lens, and (f) a reticle, and a projection optical system for imaging the reticle onto a substrate, wherein the system for microlithography provides a zoomable numerical aperture.
    Type: Grant
    Filed: June 11, 2002
    Date of Patent: November 2, 2004
    Inventors: Mark Oskotsky, Lev Ryzhikov, Scott Coston, James Tsacoyeanes, Walter Augustyn
  • Patent number: 6775069
    Abstract: The present invention relates to an illumination system including an illumination source, a beam conditioner placed in an optical path with the illumination source, a first diffractive array, a condenser system and a second diffractive array. The illumination source directs light through the beam conditioner onto the first diffractive array. The light is then directed to the condenser system placed in an optical path between the first diffractive array and second diffractive array. The condenser system includes a plurality of stationary optical elements and a plurality of movable optical elements. The plurality of movable optical elements are placed in an optical path with the plurality of stationary optical elements. The movable optical elements are capable of translation between the plurality of stationary optical element to zoom the light received from the first diffractive array.
    Type: Grant
    Filed: October 16, 2002
    Date of Patent: August 10, 2004
    Assignee: ASML Holding N.V.
    Inventors: Mark Oskotsky, Lev Ryzhikov, Scott Coston, James Tsacoyeanes, Peter J. Baumgartner, Walter Augustyn
  • Publication number: 20030227609
    Abstract: A system for microlithography comprises an illumination source; an illumination optical system including, in order from an objective side, (a) a first diffractive optical element that receives illumination from the illumination source, (b) a zoom lens, (c) a second diffractive optical element, (d) a condenser lens, (e) a relay lens, and (f) a reticle, and a projection optical system for imaging the reticle onto a substrate, wherein the system for microlithography provides a zoomable numerical aperture.
    Type: Application
    Filed: June 11, 2002
    Publication date: December 11, 2003
    Applicant: ASML US, Inc.
    Inventors: Mark Oskotsky, Lev Ryzhikov, Scott Coston, James Tsacoyeanes, Walter Augustyn
  • Publication number: 20030117606
    Abstract: The present invention relates to a method and system for expanding a laser beam. An illumination system includes a horizontal reflective multiplexer and a vertical reflective multiplexer. The horizontal reflective multiplexer replicates the input beam along a first dimension to form a first multiplexed beam. The vertical reflective multiplexer replicates the first multiplexed beam along a second dimension to form a second multiplexed beam. In one example, the horizontal reflective multiplexer includes a first beam splitter, second beam splitter, and mirror. The vertical reflective multiplexer includes a beam splitter and mirror.
    Type: Application
    Filed: October 16, 2002
    Publication date: June 26, 2003
    Applicant: ASML US, Inc.
    Inventors: Walter Augustyn, James Tsacoyeanes
  • Publication number: 20030076679
    Abstract: The present invention relates to an illumination system including an illumination source, a beam conditioner placed in an optical path with the illumination source, a first diffractive array, a condenser system and a second diffractive array. The illumination source directs light through the beam conditioner onto the first diffractive array. The light is then directed to the condenser system placed in an optical path between the first diffractive array and second diffractive array. The condenser system includes a plurality of stationary optical elements and a plurality of movable optical elements. The plurality of movable optical elements are placed in an optical path with the plurality of stationary optical elements. The movable optical elements are capable of translation between the plurality of stationary optical element to zoom the light received from the first diffractive array.
    Type: Application
    Filed: October 16, 2002
    Publication date: April 24, 2003
    Applicant: ASML US, Inc.
    Inventors: Mark Oskotsky, Lev Ryzhikov, Scott Coston, James Tsacoyeanes, Peter J. Baumgartner, Walter Augustyn