Patents by Inventor Walter Bantz

Walter Bantz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Eddy current probe and inspection method
    Publication number: 20060132124
    Abstract: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.
    Type: Application
    Filed: December 21, 2004
    Publication date: June 22, 2006
    Inventors: Mottito Togo, Changting Wang, Yuri Plotnikov, Shyamsunder Mandayam, William McKnight, Walter Bantz, Ui Suh