Abstract: This invention describes an apparatus and a method for integrity monitoring of a borehole and the seal integrity of a caprock suitable for sequestration of greenhouse gases. The apparatus includes plural neutrally buoyant sensors for placement outside of a casing, placement including distribution within at least mud filter cake, cement, and proppant. This invention also includes a method for monitoring integrity of a borehole suitable for sequestration of greenhouse gases or other types of well using the described apparatus.

Abstract: This invention relates to an apparatus and a method for a wireless sensor to monitor barrier system integrity, such as used or employed during sequestration of greenhouse gases. This invention includes an apparatus for integrity monitoring of a borehole suitable for sequestration of greenhouse gases. The apparatus includes one or more sensors for placement outside of a casing to monitor a borehole, and a tool for movement within the casing to power and interrogate the one or more sensors. This invention also includes a method for monitoring integrity of a borehole suitable for sequestration of greenhouse gases or other types of well. The method includes the step of disposing one or more sensors outside a casing and the step of powering the one or more sensors with a tool inside the casing. The method also includes the step of interrogating the one or more sensors with the tool to monitor an engineered borehole and/or a natural caprock seal.

Abstract: Disclosed are methods and systems for locating and classifying optical sources. In one aspect, a pair of imaging spectrometers is orthogonally oriented relative to an optical axis to accommodate simultaneous creation of two diffraction profiles for each imaged optical source. Such orientation increases the accuracy of detecting diffraction profiles of interest (“DPI”), as a DPI will not be declared unless it is sensed by both spectrometers. Furthermore, the spectrometers' orientation allows data such as a two-dimensional angle of incidence to be collected from an identified DPI without identification of either DPI's 0th order ray segment, thereby increasing the accuracy of the collected data. Such increased accuracy in both data determinations allows optical sources to be more accurately located and classified as information such as wavelength, amplitude, etc. may be calculated from the detected DPI with a greater degree of accuracy. Furthermore, false DPI detections are minimized.

Abstract: Disclosed are methods and systems for locating and classifying optical sources. In one aspect, a pair of imaging spectrometers is orthogonally oriented relative to an optical axis to accommodate simultaneous creation of two diffraction profiles for each imaged optical source. Such orientation increases the accuracy of detecting diffraction profiles of interest (“DPI”), as a DPI will not be declared unless it is sensed by both spectrometers. Furthermore, the spectrometers' orientation allows data such as a two-dimensional angle of incidence to be collected from an identified DPI without identification of either DPI's 0th order ray segment, thereby increasing the accuracy of the collected data. Such increased accuracy in both data determinations allows optical sources to be more accurately located and classified as information such as wavelength, amplitude, etc. may be calculated from the detected DPI with a greater degree of accuracy. Furthermore, false DPI detections are minimized.