Abstract: A suspension clamp is disclosed for clamping a disk drive suspension to an actuator arm. The suspension clamp comprises a housing including a spring operable to bias a latching member, wherein the latching member is rotatable about a pivot. After compressing the spring and rotating the latching member in a first direction, the latching member is operable to clamp the suspension to the actuator arm by decompressing the spring.

Abstract: A suspension clamp is disclosed for clamping a disk drive suspension to an actuator arm. The suspension clamp comprises a housing including a spring operable to bias a latching member, wherein the latching member is rotatable about a pivot. After compressing the spring and rotating the latching member in a first direction, the latching member is operable to clamp the suspension to the actuator arm by decompressing the spring.

Abstract: A transfer tool is disclosed for clamping a disk drive suspension to an actuator arm. The transfer tool comprises a first actuator operable to actuate at least one push pin to compress a spring of a suspension clamp, and a second actuator operable to actuate a driving pin, wherein the driving pin for rotating a latching member of the suspension clamp about a pivot.

Abstract: A suspension clamp is disclosed for clamping a disk drive suspension to an actuator arm. The suspension clamp comprises a housing including a spring operable to bias a latching member, wherein the latching member is rotatable about a pivot. After compressing the spring and rotating the latching member in a first direction, the latching member is operable to clamp the suspension to the actuator arm by decompressing the spring.

Abstract: A tester for a testing a Hard Disk Drive (HDD) flex circuit prior to electrical installation of a Head Gimbal Assembly (HGA) includes a shorting block that makes electrical contact to the bondpads on the sample. The shorting block includes one or more electrical contacts that are electrically grounded and have a size and/or configuration to contact the bondpads as well as the surface of the sample around the bondpads to accommodate positioning tolerances of the sample under test, without need for optics, precise probes, or precision stages. The electrical contacts of the shorting block may be, e.g., a matrix of pogopins or a flexible electrically-conductive material. During testing, the bondpads are shorted together and to ground with the shorting block while it is determined whether Short failures are properly detected. While the shorting block is not engaged with the bondpads, it is determined whether open failures are properly detected.