Abstract: Alignment of antenna radiating elements is monitored by diode lasers which have polarized light reflected from the body of the antenna toward a detector array. The array monitors displacement of polarized radiations from a diode laser corresponding to displacements of the antenna body. Signals from the array to electronically compensate for misalignment or may be utilized in a servo system for mechanically correcting misalignment.

Abstract: A radiation filter structure having combined wavelength and polarization sensitive characteristics and which is constructed on a single substrate. A plurality of different wavelength (.lambda.1 to .lambda.n) interference filter coatings are applied to different areas of the filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.1 to .lambda.n are passed by the different stripe areas. Moreover, a plurality of different polarization filters of both parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arragement includes first and second interference filter stripes for each wavelength .lambda.1 to .lambda.n, and a parallel polarization filter for each first stripe for each wavelength .lambda.1 to .lambda.n, and a perpendicular polarization filter for each second stripe for each wavelength .lambda.1 to .lambda.

Abstract: A system for detecting and analyzing polarized radiation incident with a skewed polarization plane while utilizing radiation filter structures having combined wavelength and polarization sensitive characteristics. The system includes first and second radiation filters each of which comprises a plurality of different wavelength .lambda.l to .lambda.n interference filter coatings applied to a filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.l to .lambda.n are passed by the different stripes. Moreover, a plurality of different polarization filters of either parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arrangement includes first and second interference filter stripes for each wavelength .lambda.l to .lambda.n, a parallel polarization filter for each wavelength .lambda.l to .lambda.

Abstract: A system for detecting and analyzing polarized radiation having a circular polarization component while utilizing radiation filter structures having combined wavelength and polarization sensitive characteristics. The system includes a radiation filter which comprises a plurality of different wavelength .lambda.1 to .lambda.n interference filter coatings applied to a filter substrate as a plurality of parallel adjacent stripes, such that different wavelengths .lambda.1 to .lambda.n are passed by the different stripes. Moreover, a plurality of different polarization filters of either parallel polarization or perpendicular polarization, are also applied as a plurality of parallel adjacent stripes to the different areas of the filter substrate. The arrangement includes first, second, third and fourth interference filter stripes for each wavelength .lambda.1 to .lambda.n, two parallel polarization filters for each wavelength .lambda.1 to .lambda.n, and two perpendicular polarization filters for each wavelength .

Abstract: An instrument for measuring the retroreflectance properties of surfaces to angles including an angle of zero degrees of the incident beam. The instrument comprises a source of collimated radiation, a beam splitter such as a cube biprism, a beam chopper, a radiation sensor system operated in a coherent detection mode with the chopper, and indicating and/or recording means. A beam of radiation aimed at a normal incidence at the surface of the test specimen is passed through the biprism which has its 45.degree. diagonal semi-reflecting surface interposed in the beam. The undesirable part of the beam is reflected off the diagonal surface to and through one of the sides of the biprism and the reflection back therefrom passes through the diagonal surface and then travels to the radiation sensor. The desirable part of the beam from the radiation source goes directly through the diagonal surface and passes to the surface of the specimen.