Patents by Inventor Walter G. Eppler

Walter G. Eppler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6519372
    Abstract: A system and method that computes the degree of translational offset between corresponding blocks extracted from images acquired by two sensors, such as electro-optic, infrared sensors, and radar for example, so that the images can be spatially registered. The present invention uses fast Fourier transform (FFT) correlation to provide for speed, and also uses gradient magnitude and phase (direction) information to provide for reliability and robustness.
    Type: Grant
    Filed: August 31, 1999
    Date of Patent: February 11, 2003
    Assignee: Lockheed Martin Corporation
    Inventors: Walter G. Eppler, David W. Paglieroni, Sidney M. Petersen, Marcus J. Louie
  • Patent number: 6084989
    Abstract: A system and method for determining offset errors between line and pixel coordinates of landmarks in a digitized image generated by an imaging system disposed on a spacecraft and line and pixel coordinates predicted by a mathematical model of the imaging system using landmark geodetic coordinates on the Earth. The system and method use landmarks in symbolic form, such as perimeters of lakes and islands that are stored in a database. A digitized image generated by the satellite-based imaging system is processed to extract a patch of the image containing a landmark. The image patch is then upsampled (magnified). The landmark boundary is processed using a mathematical model of the imaging system to generate absolute coordinates of the boundary pixels, which are upsampled and rasterized to produce a landmark mask.
    Type: Grant
    Filed: November 15, 1996
    Date of Patent: July 4, 2000
    Assignee: Lockheed Martin Corporation
    Inventor: Walter G. Eppler