Patents by Inventor Walter Gray, III

Walter Gray, III has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Low cost memory tester with high throughput
    Patent number: 6204679
    Abstract: An automatic test system for testing semiconductor devices, particularly memory devices. The test system includes a handling device with several temperature controlled chambers, each associated with a test head. Trays of devices are loaded into the handling device and are brought to thermal equilibrium in each chamber before being tested. The number of test sites within each chamber is varied in inverse proportion to the time it takes to test a device at the temperature within the chamber.
    Type: Grant
    Filed: November 4, 1998
    Date of Patent: March 20, 2001
    Assignee: Teradyne, Inc.
    Inventor: Walter Gray, III