Abstract: A dosimetry system for monitoring radiation exposure for a device under inspection comprises a support structure, a plurality of detectors, a signal processing unit, and a computing device. The support structure includes an upper surface on which the device under inspection is positioned. The detectors are positioned in proximity to the device under inspection. Each detector is configured to detect radiation and generate a radiation electronic signal whose level varies according to an amount of radiation to which the detector is exposed. The signal processing unit is configured to receive the radiation electronic signal from each detector and output data derived from the radiation electronic signals. The computing device is configured to receive the data from the signal processing unit and determine an accumulated radiation level for each detector.

Abstract: Microsized devices operable to emit neutrons in a selective manner are provided. The devices are configured so that the rate of neutron emission can be varied, either actively or passively. The devices comprise an a-particle emitting material and a neutron producing target material that when aligned and/or positioned a predetermined distance apart emit neutrons. The rate of neutron emission can be slowed or stopped by taking the materials out of alignment and/or attenuating the ?-particles being directed toward the neutron producing target material.

Abstract: Microsized devices operable to emit neutrons in a selective manner are provided. The devices are configured so that the rate of neutron emission can be varied, either actively or passively. The devices comprise an a-particle emitting material and a neutron producing target material that when aligned and/or positioned a predetermined distance apart emit neutrons. The rate of neutron emission can be slowed or stopped by taking the materials out of alignment and/or attenuating the ?-particles being directed toward the neutron producing target material.