Patents by Inventor Walter P. Kern

Walter P. Kern has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe for testing electronic components
    Patent number: 4812745
    Abstract: A probe for electrically contacting a lead of an electronic component providing accurate spacing between tip portions by using an insulator guide having holes through it and positioning wires in the holes so that tip portions of the wires extend from a probe surface.
    Type: Grant
    Filed: May 29, 1987
    Date of Patent: March 14, 1989
    Assignee: Teradyne, Inc.
    Inventor: Walter P. Kern
  • Electrically shielded connectors
    Patent number: 4724180
    Abstract: A shielding device, as for spring pins, is provided by providing a base having shielding holes, grounding holes, and a trough connecting them with an interconnected covering, providing within the shielding holes insulators with element holes therethrough.
    Type: Grant
    Filed: August 5, 1985
    Date of Patent: February 9, 1988
    Assignee: Teradyne, Inc.
    Inventor: Walter P. Kern
  • Integrated circuit testing probe
    Patent number: 4214201
    Abstract: Multi-tipped probe for testing integrated circuit elements, featuring, in various aspects, contact elements each resiliently biased in a rest position with a portion of itself spaced from a support and movable to an operating position against the support, the element tips being coplanar in the operating position; and contact elements having end portions oblique to an axis of the support and having peripheral edges at their ends for contacting the lead with the axis parallel to the lead.
    Type: Grant
    Filed: February 24, 1978
    Date of Patent: July 22, 1980
    Assignee: Teradyne, Inc.
    Inventor: Walter P. Kern