Patents by Inventor Walterus W. Van den Hoogenhof

Walterus W. Van den Hoogenhof has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for the examination of samples by means of x-rays
    Publication number: 20040240623
    Abstract: A device (1) for the examination of samples by means of X-rays or the like, the device being provided with at least one X-ray source which can be mounted in an exchangeable constructional unit (5) and with an analysis chamber (4) which encloses an exit window (6) of the X-ray source in its operative position and whereto the constructional unit (5) with the X-ray source can be attached. The device is constructed in such a manner that respective, matching parts (9; 10) of a safety system (7) are associated with the analysis chamber (4) and the constructional unit (5) with the X-ray source.
    Type: Application
    Filed: June 7, 2004
    Publication date: December 2, 2004
    Inventors: Johannes M.H. Van der Veer, Michel T. Van de Vorst, Jan Boldewijn, Walterus W. Van den Hoogenhof