Patents by Inventor Wan Je Sung

Wan Je Sung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11688465
    Abstract: A memory system includes: a memory block including a plurality of pages each comprising a plurality of memory cells connected to bit lines and a word line of word lines, an address manager configured to output addresses corresponding to the plurality of pages, and a system data manager configured to generate index data corresponding to the each of the addresses, the index data indicating whether user data is inverted, and output the index data and information on a memory cell in which the index data is to be stored, respectively. The system data manager is configured to, determine memory cells connected to different bit lines from among memory cells included in adjacent pages corresponding to consecutive addresses of the addresses, as memory cells in which index data corresponding to the consecutive addresses are to be stored.
    Type: Grant
    Filed: June 28, 2021
    Date of Patent: June 27, 2023
    Assignee: SK hynix Inc.
    Inventors: Ie Ryung Park, Wan Je Sung, Dong Sop Lee, Bo Seok Jeong
  • Patent number: 11515898
    Abstract: Provided herein may be an error correction decoder, an error correction circuit having the error correction decoder, and a method of operating the error correction decoder. The error correction decoder may include a calculator configured to output an error correction message by performing an iterative decoding operation on a first codeword, a syndrome generator configured to generate a syndrome by calculating the error correction message and a parity check matrix and to output a number of iterations representing the number of times the iterative decoding operation has been performed, and an unsatisfied check node (UCN) value representing the number of unsatisfied check nodes in the syndrome, and a speed selector configured to output a speed code for controlling a speed of the iterative decoding operation depending on the number of iterations and the UCN value.
    Type: Grant
    Filed: October 9, 2020
    Date of Patent: November 29, 2022
    Assignee: SK hynix Inc.
    Inventors: Myung Jin Jo, Soon Young Kang, Wan Je Sung, Bo Seok Jeong
  • Publication number: 20220208272
    Abstract: A memory system includes: a memory block including a plurality of pages each comprising a plurality of memory cells connected to bit lines and a word line of word lines, an address manager configured to output addresses corresponding to the plurality of pages, and a system data manager configured to generate index data corresponding to the each of the addresses, the index data indicating whether user data is inverted, and output the index data and information on a memory cell in which the index data is to be stored, respectively. The system data manager is configured to, determine memory cells connected to different bit lines from among memory cells included in adjacent pages corresponding to consecutive addresses of the addresses, as memory cells in which index data corresponding to the consecutive addresses are to be stored.
    Type: Application
    Filed: June 28, 2021
    Publication date: June 30, 2022
    Inventors: Ie Ryung PARK, Wan Je SUNG, Dong Sop LEE, Bo Seok JEONG
  • Publication number: 20210359710
    Abstract: Provided herein may be an error correction decoder, an error correction circuit having the error correction decoder, and a method of operating the error correction decoder. The error correction decoder may include a calculator configured to output an error correction message by performing an iterative decoding operation on a first codeword, a syndrome generator configured to generate a syndrome by calculating the error correction message and a parity check matrix and to output a number of iterations representing the number of times the iterative decoding operation has been performed, and an unsatisfied check node (UCN) value representing the number of unsatisfied check nodes in the syndrome, and a speed selector configured to output a speed code for controlling a speed of the iterative decoding operation depending on the number of iterations and the UCN value.
    Type: Application
    Filed: October 9, 2020
    Publication date: November 18, 2021
    Inventors: Myung Jin JO, Soon Young KANG, Wan Je SUNG, Bo Seok JEONG
  • Patent number: 11128315
    Abstract: Devices and methods for error correction are described. An exemplary error correction decoder includes a mapper configured to generate, based on a first set of read values corresponding to a first codeword, a first set of log likelihood ratio (LLR) values; a first buffer, coupled to the mapper, configured to store the first set of LLR values received from the mapper; and a node processor, coupled to the first buffer, configured to perform a first error correction decoding operation using the first set of LLR values received from the first buffer, wherein a first iteration of the first error correction decoding operation comprises refraining from updating values of one or more variable nodes, and performing a syndrome check using a parity check matrix and sign bits of the first set of LLR values stored in the first buffer.
    Type: Grant
    Filed: October 8, 2019
    Date of Patent: September 21, 2021
    Assignee: SK hynix Inc.
    Inventors: Myung Jin Jo, Dae Sung Kim, Wan Je Sung
  • Patent number: 11055164
    Abstract: There are provided an error correction decoder and a memory system having the same. The error correction decoder includes a node processor for performing at least one iteration of an error correction decoding based on at least one parameter used for an iterative decoding, a reliability information generator for generating reliability information corresponding to a current iteration upon a determination that the error correction decoding corresponding to the current iteration has been unsuccessful, and a parameter adjuster for adjusting the at least one parameter upon a determination that the reliability information satisfies a predetermined condition, and controlling the node processor to perform a next iteration based on the adjusted.
    Type: Grant
    Filed: November 6, 2019
    Date of Patent: July 6, 2021
    Assignee: SK hynix Inc.
    Inventors: Soon Young Kang, Dae Sung Kim, Wan Je Sung, Myung Jin Jo, Jae Young Han
  • Publication number: 20200341829
    Abstract: There are provided an error correction decoder and a memory system having the same. The error correction decoder includes a node processor for performing at least one iteration of an error correction decoding based on at least one parameter used for an iterative decoding, a reliability information generator for generating reliability information corresponding to a current iteration upon a determination that the error correction decoding corresponding to the current iteration has been unsuccessful, and a parameter adjuster for adjusting the at least one parameter upon a determination that the reliability information satisfies a predetermined condition, and controlling the node processor to perform a next iteration based on the adjusted.
    Type: Application
    Filed: November 6, 2019
    Publication date: October 29, 2020
    Inventors: Soon Young Kang, Dae Sung Kim, Wan Je Sung, Myung Jin Jo, Jae Young Han
  • Publication number: 20200313693
    Abstract: Devices and methods for error correction are described. An exemplary error correction decoder includes a mapper configured to generate, based on a first set of read values corresponding to a first codeword, a first set of log likelihood ratio (LLR) values; a first buffer, coupled to the mapper, configured to store the first set of LLR values received from the mapper; and a node processor, coupled to the first buffer, configured to perform a first error correction decoding operation using the first set of LLR values received from the first buffer, wherein a first iteration of the first error correction decoding operation comprises refraining from updating values of one or more variable nodes, and performing a syndrome check using a parity check matrix and sign bits of the first set of LLR values stored in the first buffer.
    Type: Application
    Filed: October 8, 2019
    Publication date: October 1, 2020
    Inventors: Myung Jin Jo, Dae Sung Kim, Wan Je Sung
  • Publication number: 20200067538
    Abstract: An error correction device includes: a plurality of variable node units each configured to: receive a hard decision bit and a channel reliability value having a first bit-precision; and perform an iteration of a decoding operation on the hard decision bit based on the channel reliability value; a plurality of check node units each configured to: receive one or more reference reliability values having a second bit-precision from one or more variable node units coupled thereto among the plurality of variable node units during the iteration; and transmit, based on the one or more reference reliability values, one or more check reliability values having the second bit-precision to the one or more variable node units coupled thereto, wherein, during the iteration, each of the plurality of variable node units further: receives one or more first check reliability values from one or more check node units coupled thereto among the plurality of check node units; and updates the hard decision bit with reference to the c
    Type: Application
    Filed: December 17, 2018
    Publication date: February 27, 2020
    Inventors: Dae Sung KIM, Myung Jin JO, Soon Young KANG, Wan Je SUNG
  • Patent number: 10554228
    Abstract: An error correction device includes: a plurality of variable node units each configured to: receive a hard decision bit and a channel reliability value having a first bit-precision; and perform an iteration of a decoding operation on the hard decision bit based on the channel reliability value; a plurality of check node units each configured to: receive one or more reference reliability values having a second bit-precision from one or more variable node units coupled thereto among the plurality of variable node units during the iteration; and transmit, based on the one or more reference reliability values, one or more check reliability values having the second bit-precision to the one or more variable node units coupled thereto, wherein, during the iteration, each of the plurality of variable node units further: receives one or more first check reliability values from one or more check node units coupled thereto among the plurality of check node units; and updates the hard decision bit with reference to the c
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: February 4, 2020
    Assignee: SK hynix Inc.
    Inventors: Dae Sung Kim, Myung Jin Jo, Soon Young Kang, Wan Je Sung