Patents by Inventor Wan-Yun Lin

Wan-Yun Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrostatic discharge protection circuit
    Patent number: 6864536
    Abstract: An electrostatic discharge (ESD) protection device includes a semiconductor layer, a source region formed in the layer, a drain region formed in the layer, a channel region in the layer between the source and drain regions, and a gate over the channel region. A plurality of current divider segments are distributed on the drain region and extend between the gate and drain contacts. The segments can be formed of polysilicon or a field oxide.
    Type: Grant
    Filed: December 20, 2000
    Date of Patent: March 8, 2005
    Assignee: Winbond Electronics Corporation
    Inventors: Shi-Tron Lin, Wei-Fan Chen, Chenhsin Lien, Wan-Yun Lin
  • Electrostatic discharge protection circuit
    Publication number: 20020074602
    Abstract: An electrostatic discharge (ESD) protection device includes a semiconductor layer, a source region formed in the layer, a drain region formed in the layer, a channel region in the layer between the source and drain regions, and a gate over the channel region. A plurality of current divider segments are distributed on the drain region and extend between the gate and drain contacts. The segments can be formed of polysilicon or a field oxide.
    Type: Application
    Filed: December 20, 2000
    Publication date: June 20, 2002
    Applicant: Winbond Electronics Corporation
    Inventors: Shi-Tron Lin, Wei-Fan Chen, Chenhsin Lien, Wan-Yun Lin