Patents by Inventor Wang XIAOJUN

Wang XIAOJUN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test pin configuration for test device for testing devices under test
    Patent number: 10197599
    Abstract: A test pin for a test device for electrically contacting a device under test to be tested, wherein the test pin comprises an electrically conductive base structure for electrically conducting a test signal between the device under test and the test device, and an exchangeable electrically conductive pin tip body configured to directly contact the device under test and to be exchangeably assembled with the base structure.
    Type: Grant
    Filed: December 16, 2015
    Date of Patent: February 5, 2019
    Assignee: Infineon Technologies AG
    Inventors: Fu San Hiew, Siao Kiat Tan, Wee Kuan Tan, Arieff Ridzwan Yussuff, Murad Hudda, Wang Xiaojun, Ge Dandong, Yusman Sugianto, Tay Chyeo Yong, Lee Chow York, Gan Swee Lee
  • Test Pin Configuration for Test Device for Testing Devices Under Test
    Publication number: 20170176494
    Abstract: A test pin for a test device for electrically contacting a device under test to be tested, wherein the test pin comprises an electrically conductive base structure for electrically conducting a test signal between the device under test and the test device, and an exchangeable electrically conductive pin tip body configured to directly contact the device under test and to be exchangeably assembled with the base structure.
    Type: Application
    Filed: December 16, 2015
    Publication date: June 22, 2017
    Inventors: Fu San HIEW, Siao Kiat TAN, Wee Kuan TAN, Arieff Ridzwan YUSSUFF, Murad HUDDA, Wang XIAOJUN, Ge DANDONG, Yusman SUGIANTO, Tay CHYEO YONG, Lee CHOW YORK, Gan SWEE LEE