Patents by Inventor Wang Y. Oh

Wang Y. Oh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8937724
    Abstract: Exemplary embodiments of systems and methods can be provided which can generate data associated with at least one sample. For example, using at least one first arrangement, it is possible to forward at least one first radiation to the sample(s) so as to cause at least one second radiation to be provided from the sample(s) that can be based on the first radiation(s). In addition, using at least one second arrangement, it is possible to receive the second radiation from the sample(s), generate a plurality of distinct measurements regarding at least one portion of the sample(s) based the second radiation(s), and characterize the portion(s) over a plurality of continuous resolvable depth points thereof which are associated with the distinct measurements. Further, the characterization of the at least one portion can be resolved and distinctly characterized at a number of the depth points which is greater than a number of the distinct measurements.
    Type: Grant
    Filed: December 10, 2009
    Date of Patent: January 20, 2015
    Assignee: The General Hospital Corporation
    Inventors: Benjamin J. Vakoc, Wang Y. Oh, Guillermo J. Tearney, Brett E. Bouma
  • Publication number: 20100150422
    Abstract: Exemplary embodiments of systems and methods can be provided which can generate data associated with at least one sample. For example, using at least one first arrangement, it is possible to forward at least one first radiation to the sample(s) so as to cause at least one second radiation to be provided from the sample(s) that can be based on the first radiation(s). In addition, using at least one second arrangement, it is possible to receive the second radiation from the sample(s), generate a plurality of distinct measurements regarding at least one portion of the sample(s) based the second radiation(s), and characterize the portion(s) over a plurality of continuous resolvable depth points thereof which are associated with the distinct measurements. Further, the characterization of the at least one portion can be resolved and distinctly characterized at a number of the depth points which is greater than a number of the distinct measurements.
    Type: Application
    Filed: December 10, 2009
    Publication date: June 17, 2010
    Applicant: The General Hospital Corporation
    Inventors: Benjamin J. Vakoc, Wang Y. Oh, Guillermo J. Tearney, Brett E. Bouma