Abstract: Free-form discovery of differential equations for modeling a physical system or process under investigation that includes defining a formal language sentence grammar that describes admissible relationships between quantities, and incorporating the use of such grammar for free-(functional) form, automatic discovery of differential equations. The method requires minimum knowledge of the desired differential equation and is universally applicable to ordinary and partial differential equations.

Abstract: A system and a method determine a quality of a doped semiconductor layer in terms of a charge carrier density gradient by measuring two magnetic-field-dependent resistances using four contacts of a specimen.

Abstract: A highly sensitive gravimeter using a magnetic parallel dipole line (PDL) trap system is provided. In one aspect, a gravimeter includes: a vacuum enclosure; a PDL trap within the vacuum enclosure, the PDL trap having a pair of dipole line magnets, and a diamagnetic rod levitating in between the dipole line magnets; and a heater and temperature sensor within the vacuum enclosure configured to maintain a constant temperature within the vacuum enclosure that is greater than a temperature outside of the vacuum enclosure and precision frequency measurement system. The frequency of the oscillation of the trapped diamagnetic rod will yield the local gravitational acceleration. Methods for measuring a local gravitational field using the present gravimeter are also provided.

Abstract: In various embodiments, wavelength beam combining laser systems incorporate etalons to establish external lasing cavities and/or to combine multiple input beams into a single output beam.

Abstract: In various embodiments, wavelength beam combining laser systems incorporate etalons to establish external lasing cavities and/or to combine multiple input beams into a single output beam.

Abstract: In various embodiments, wavelength beam combining laser systems incorporate etalons to establish external lasing cavities and/or to combine multiple input beams into a single output beam.

Abstract: A probe assembly includes plural capacitive contacts that are separate from each other and a conductive depletion gate disposed between and separating the contacts from each other. The depletion gate is configured to receive a direct electric voltage to deplete regions of a sample under test of electrons. The contacts are configured to be placed in close proximity to a buried conducting layer in the sample under test without engaging the buried conducting layer, thereby capacitively coupling to the buried conducting layer. A first subset of the capacitive contacts is configured to apply an alternating electric current to a portion of the sample under test and a second subset of the capacitive contacts is configured to sense an alternating voltage response of the portion of the sample under test to characterize one or more electrical properties of the sample under test without the capacitive contact with the buried conductive layer.

Abstract: In various embodiments, wavelength beam combining laser systems incorporate etalons to establish external lasing cavities and/or to combine multiple input beams into a single output beam.

Abstract: A system and a method determine a quality of a doped semiconductor layer in terms of a charge carrier density gradient by measuring two magnetic-field-dependent resistances using four contacts of a specimen.

Abstract: In various embodiments, wavelength beam combining laser systems incorporate etalons to establish external lasing cavities and/or to combine multiple input beams into a single output beam.

Abstract: A probe assembly includes plural capacitive contacts that are separate from each other and a conductive depletion gate disposed between and separating the contacts from each other. The depletion gate is configured to receive a direct electric voltage in order to deplete regions of a sample under test of electrons. The contacts are configured to be placed in close proximity to a buried conducting layer in the sample under test without engaging the buried conducting layer, thereby capacitively coupling to the buried conducting layer. A first subset of the capacitive contacts is configured to apply an alternating electric current to a portion of the sample under test and a second subset of the capacitive contacts is configured to sense an alternating voltage response of the portion of the sample under test in order to characterize one or more electrical properties of the sample under test without the capacitive contacts having ohmic contact with the buried conducting layer.

Abstract: A device for removing an insert molded article and simultaneously placing a preformed item, includes a bracket; a removing mechanism slidably mounted to the bracket, the removing mechanism comprises a suck for sucking the insert molded article; a placing mechanism slidably mounted to the bracket, the placing mechanism comprises a holding base for holding the preformed item; a first driving element mounted to the bracket and connected to the removing mechanism to drive the removing mechanism to slide relative to the bracket; and a second driving element mounted to the bracket and connected to the placing mechanism to drive the placing mechanism to slide relative to the bracket.