Abstract: A method and apparatus provide an improved identification and isolation of defective blocks in non-volatile memory devices having a plurality of user accessible blocks of non-volatile storage elements where each block also has an associated defective block latch. The method provides for sensing each defective block latch to determine whether the defective block latch was set due to a defect, and storing, in temporary on chip memory, address data corresponding to each set latch. The method further involves retrieving the address data and disabling defective blocks based upon the address data. A non-volatile memory device is also described having a controller which senses the defective block latches, stores address data for each block having a set latch, and subsequently retrieves the stored address data to set the defective block latches based upon the address data.

Abstract: A method and apparatus provide an improved identification and isolation of defective blocks in non-volatile memory devices having a plurality of user accessible blocks of non-volatile storage elements where each block also has an associated defective block latch. The method provides for sensing each defective block latch to determine whether the defective block latch was set due to a defect, and storing, in temporary on chip memory, address data corresponding to each set latch. The method further involves retrieving the address data and disabling defective blocks based upon the address data. A non-volatile memory device is also described having a controller which senses the defective block latches, stores address data for each block having a set latch, and subsequently retrieves the stored address data to set the defective block latches based upon the address data.