Abstract: A method for generating a pre-trained language model, includes: obtaining sample files; obtaining typography structure information and text information of the sample files by parsing the sample files; obtaining a plurality of task models of a pre-trained language model; obtaining a trained pre-trained language model by jointly training the pre-trained language model and the plurality of task models according to the typography structure information and the text information; and generating a target pre-trained language model by fine-tuning the trained pre-trained language model according to the typography structure information and the text information.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: A phase frequency detector compares a reference clock signal to a feedback clock signal to generate pulses in one or more output signals. The one or more output signals have a minimum pulse width. The phase frequency detector has a temperature sensing circuit. The phase frequency detector adjusts the minimum pulse width of the one or more output signals using the temperature sensing circuit to compensate for variations in the temperature of the phase frequency detector.

Abstract: Techniques are provided for compensating for phase and timing delays in clock signals generated by phase-locked loops and delay-locked loops on integrated circuits. Circuit elements coupled in a feedback loop of a locked circuit can compensate for the timing and phase delays between an input pin and an output pin. Other circuit elements coupled in the feedback loop of a locked circuit can compensate for the delay between an input pin and a destination circuit element. Still other circuit elements coupled in an input reference path of a locked circuit preserve a timing relationship between input clock and input data signals. A clock signal and a data signal received at a destination circuit element have the same phase and timing relationship that exists between the input clock and input data signals at input pins.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: A feedback loop, such as a phase-locked loop, on an integrated circuit has a detector, a charge pump, and a loop filter. The charge pump adjusts its output current in response to variations in a process of the integrated circuit to reduce variations in the loop bandwidth. The charge pump also adjusts its output current in response to variations in a resistance of a resistor in the loop filter to reduce variations in the loop bandwidth. The charge pump can also adjust its output current in response to variations in a temperature of the integrated circuit to reduce variations in the loop bandwidth. A delay-locked loop on an integrated circuit has a phase detector and a charge pump. The charge pump adjusts its output current in response to variations in the temperature and the process of the integrated circuit to reduce changes in the loop bandwidth.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: A phase frequency detector compares a reference clock signal to a feedback clock signal to generate pulses in one or more output signals. The one or more output signals have a minimum pulse width. The phase frequency detector has a temperature sensing circuit. The phase frequency detector adjusts the minimum pulse width of the one or more output signals using the temperature sensing circuit to compensate for variations in the temperature of the phase frequency detector.

Abstract: A sensing circuit senses the programmed state of fuses such as polysilicon (poly) fuses. In a preferred embodiment, the sensing circuit comprises first and second amplifier stages, a fuse and a reference resistor wherein the fuse and the reference resistor are connected, respectively, to first and second inputs of the first amplifier stage. The first and second amplifier stages are differential amplifiers and the output of the second amplifier stage is buffered. Circuitry for programming the fuse is part of the sensing circuit.

Abstract: A programmable logic device includes configurable phase-locked loop (PLL) circuitry that outputs multiple clock signals having programmable phases and frequencies. Each output signal is programmably selectable for use as an external clock, internal global clock, internal local clock, or combinations thereof. The PLL circuitry has programmable frequency dividing, including programmable cascaded frequency dividing, and programmable output signal multiplexing that provide a high degree of clock design flexibility.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE-Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: A programmable logic device includes configurable phase-locked loop (PLL) circuitry that outputs multiple clock signals having programmable phases and frequencies. Each output signal is programmably selectable for use as an external clock, internal global clock, internal local clock, or combinations thereof. The PLL circuitry has programmable frequency dividing, including programmable cascaded frequency dividing, and programmable output signal multiplexing that provide a high degree of clock design flexibility.

Abstract: Enhanced passgate structures for use in low-voltage systems are presented in which the influence of Vt on the range of signals passed by single-transistor passgates is reduced. In one arrangement, the VGATE?Vt limit for signals propagated through NMOS passgates is raised by applying a higher VGATE; in another arrangement, the Vt is lowered. The use of CMOS passgates in applications where single-transistor passgates have traditionally been used is also presented.

Abstract: A programmable logic device includes configurable phase-locked loop (PLL) circuitry that outputs multiple clock signals having programmable phases and frequencies. Each output signal is programmably selectable for use as an external clock, internal global clock, internal local clock, or combinations thereof. The PLL circuitry has programmable frequency dividing, including programmable cascaded frequency dividing, and programmable output signal multiplexing that provide a high degree of clock design flexibility.

Abstract: A PLL circuit is described. The PLL circuit includes: a signal generator; and a spread spectrum modulator coupled to the signal generator, where the spread spectrum modulator receives a control voltage as an input and provides a spread spectrum control voltage to the signal generator in response to the control voltage. In one embodiment, the spread spectrum modulator includes at least one selector, where the at least one selector selects a plurality of voltage levels that correspond to a spread mode and percentage of spread for the spread spectrum modulator.

Abstract: A programmable logic device includes configurable phase-locked loop (PLL) circuitry that outputs multiple clock signals having programmable phases and frequencies. Each output signal is programmably selectable for use as an external clock, internal global clock, internal local clock, or combinations thereof. The PLL circuitry has programmable frequency dividing, including programmable cascaded frequency dividing, and programmable output signal multiplexing that provide a high degree of clock design flexibility.

Abstract: A PLL circuit is described. The PLL circuit includes: a feedback loop and a loop filter coupled to the feedback loop, where the loop filter is programmable to provide one of a plurality of bandwidths. In one embodiment, the loop filter is programmable to provide one of a plurality of resistances, each resistance of the plurality of resistances corresponding to one of the plurality of bandwidths. In one embodiment, the feedback loop includes a detector and a signal generator coupled to the detector.

Abstract: A PLL circuit is described. The PLL circuit includes: a signal generator; and a spread spectrum modulator coupled to the signal generator, where the spread spectrum modulator receives a control voltage as an input and provides a spread spectrum control voltage to the signal generator in response to the control voltage. In one embodiment, the spread spectrum modulator includes at least one selector, where the at least one selector selects a plurality of voltage levels that correspond to a spread mode and percentage of spread for the spread spectrum modulator.

Abstract: At least some of the interconnection signaling on a programmable logic device (“PLD”) is by differential signaling using differential driver circuitry to apply differential signals to a pair of conductors that extend to differential receiver circuitry. Such differential interconnection signaling helps the PLD operate satisfactorily with lower power supply voltages. The conductors in each differential signaling pair may cross over one another at various intervals in order to help reduce the adverse effects of capacitive coupling between adjacent and parallel signaling paths.

Abstract: A testing circuit and method for a phase-locked loop allow measurement of leakage currents in the phase-locked loop components. By forcing the output of the phase-frequency detector to a particular state, the charge pump can be disabled. This disables the effect of feedback in the phase-locked loop, and allowing the output frequency to be determined by the voltage on the control voltage node at the time the feedback is disabled. If there is no leakage, the control voltage, and therefore the output frequency, should remain the same as they were at the moment feedback was disabled. Monitoring the output frequency for changes provides an indication of the presence or absence of leakage. Conducting the test using two different charge pump reference currents allows one to detect leakage resulting from charge pump mismatch.