Abstract: The present disclosure relates to a method for characterizing and identifying a bioparticle. The method comprises introducing the sample to a substrate having a surface comprising a plurality of binding sites whereon bioparticles can be bound, determining, for at least one temperature, data representative for the interface thermal resistance of the surface of the substrate sufficiently long to include the detachment process of the bioparticles, and deriving, for the at least one temperature, a bioparticle retention time and/or detachment rate from the data representative for the interface thermal resistance data. The present disclosure also relates to a bio-sensing device suitable for the detection and/or characterization of target bioparticles.

Abstract: The disclosure relates to a magnetometer sensor with negatively charged nitrogen-vacancy centers in diamond. One example embodiment is a magnetometer sensor. The magnetometer sensor includes a diamond crystal with one or more negatively charged nitrogen-vacancy centers. The magnetometer sensor also includes one or more light sources. Further, the magnetometer sensor includes an electrode. In addition, the magnetometer sensor includes a read-out module. The read-out module includes a read-out circuit configured to read-out a photocurrent from the electrode and a lock-in amplifier. The lock-in amplifier includes a first input, a second input, and an output. The magnetometer sensor additionally includes a microwave source configured to apply a microwave field to the negatively charged nitrogen-vacancy centers. The microwave source includes a microwave generator for generating continuous wave microwaves and a microwave modulator configured to modulate the continuous wave microwaves.

Abstract: The present disclosure relates to a method for characterizing and identifying a bioparticle. The method comprises introducing the sample to a substrate having a surface comprising a plurality of binding sites whereon bioparticles can be bound, determining, for at least one temperature, data representative for the interface thermal resistance of the surface of the substrate sufficiently long to include the detachment process of the bioparticles, and deriving, for the at least one temperature, a bioparticle retention time and/or detachment rate from the data representative for the interface thermal resistance data. The present disclosure also relates to a bio-sensing device suitable for the detection and/or characterization of target bioparticles.

Abstract: The disclosure relates to a magnetometer sensor with negatively charged nitrogen-vacancy centers in diamond. One example embodiment is a magnetometer sensor. The magnetometer sensor includes a diamond crystal with one or more negatively charged nitrogen-vacancy centers. The magnetometer sensor also includes one or more light sources. Further, the magnetometer sensor includes an electrode. In addition, the magnetometer sensor includes a read-out module. The read-out module includes a read-out circuit configured to read-out a photocurrent from the electrode and a lock-in amplifier. The lock-in amplifier includes a first input, a second input, and an output. The magnetometer sensor additionally includes a microwave source configured to apply a microwave field to the negatively charged nitrogen-vacancy centers. The microwave source includes a microwave generator for generating continuous wave microwaves and a microwave modulator configured to modulate the continuous wave microwaves.

Abstract: A method an system is disclosed for the detection and/or allocation of at least one point mutation in target DNA and/or RNA duplexes. The method comprises obtaining a functionalized surface which is coated with probe DNA and/or RNA whereto target DNA and/or RNA duplexes are attached, contacting said functionalized surface to an electrolytic solution having a neutral pH in a flow cell and measuring a first impedance value within said electrolytic solution, and then adding a chemical to the electrolytic solution which is able to achieve denaturation of the target DNA and/or RNA. The method further comprises measuring a second impedance value within the flow cell after completion of the denaturation of the DNA and/or RNA target, and then obtaining a value representative for the impact of the chemical on the impedance of the electrolytic solution.

Abstract: The present disclosure relates to a biosensor device for detecting a predetermined target analyte. The device comprises a substrate. An aptamer bioreceptor for specifically binding to the predetermined target analyte is exposed at a functionalized surface of the substrate. The device also comprises a heat source for heating the substrate via a back surface thereof. The device further comprises a first temperature sensing element for sensing a temperature at the back side of the substrate and a second temperature sensing element for sensing a temperature at the functionalized side of the substrate. The device also comprises a signal processing unit for calculating a heat transfer resistivity value based on temperature values obtained from the first and the second temperature sensing element and the heating power generated by the heat source.

Abstract: A method an system is disclosed for characterizing DNA and/or RNA duplexes. The biosensing device comprises a heating element using a power and being suitable for providing thermal denaturation of target DNA and/or RNA bioparticles, a sample holder adapted for receiving a biocompatible substrate having a functionalized surface which is coated with probe DNA and/or RNA whereto target DNA and/or RNA duplexes can be attached, the sample holder further being adapted for exposing the biocompatible substrate at one side to the heating element, a first temperature sensing element for sensing a temperature at the side where the biocompatible substrate can be exposed to the heating element and a second temperature sensing element for sensing a temperature at the side opposite thereto with respect to the biocompatible substrate.

Abstract: A method an system is disclosed for the detection and/or allocation of at least one point mutation in target DNA and/or RNA duplexes. The method comprises obtaining a functionalized surface which is coated with probe DNA and/or RNA whereto target DNA and/or RNA duplexes are attached, contacting said functionalized surface to an electrolytic solution having a neutral pH in a flow cell and measuring a first impedance value within said electrolytic solution, and then adding a chemical to the electrolytic solution which is able to achieve denaturation of the target DNA and/or RNA. The method further comprises measuring a second impedance value within the flow cell after completion of the denaturation of the DNA and/or RNA target, and then obtaining a value representative for the impact of the chemical on the impedance of the electrolytic solution.

Abstract: A method an system is disclosed for the detection and/or allocation of at least one point mutation in target DNA and/or RNA duplexes. The method comprises obtaining a functionalized surface which is coated with probe DNA and/or RNA whereto target DNA and/or RNA duplexes are attached, contacting said functionalized surface to an electrolytic solution having a neutral pH in a flow cell and measuring a first impedance value within said electrolytic solution, and then adding a chemical to the electrolytic solution which is able to achieve denaturation of the target DNA and/or RNA. The method further comprises measuring a second impedance value within the flow cell after completion of the denaturation of the DNA and/or RNA target, and then obtaining a value representative for the impact of the chemical on the impedance of the electrolytic solution.

Abstract: The present invention relates to a method (1) for creating a diamond structure (38) on a substrate (31). This method comprises the steps of providing (2) a substrate (31), providing (3) a mold (25) on the substrate (31), providing (4) a diamond seed solution (34) in the mold (25), and removing (6) the mold (25) such that a diamond structure (38) remains on the substrate (31).

Abstract: A method an system is disclosed for characterising DNA and/or RNA duplexes. The biosensing device comprises a heating element using a power and being suitable for providing thermal denaturation of target DNA and/or RNA bioparticles, a sample holder adapted for receiving a biocompatible substrate having a functionalized surface which is coated with probe DNA and/or RNA whereto target DNA and/or RNA duplexes can be attached, the sample holder further being adapted for exposing the biocompatible substrate at one side to the heating element, a first temperature sensing element for sensing a temperature at the side where the biocompatible substrate can be exposed to the heating element and a second temperature sensing element for sensing a temperature at the side opposite thereto with respect to the biocompatible substrate.

Abstract: A method an system is disclosed for the detection and/or allocation of at least one point mutation in target DNA and/or RNA duplexes. The method comprises obtaining a functionalized surface which is coated with probe DNA and/or RNA whereto target DNA and/or RNA duplexes are attached, contacting said functionalized surface to an electrolytic solution having a neutral pH in a flow cell and measuring a first impedance value within said electrolytic solution, and then adding a chemical to the electrolytic solution which is able to achieve denaturation of the target DNA and/or RNA. The method further comprises measuring a second impedance value within the flow cell after completion of the denaturation of the DNA and/or RNA target, and then obtaining a value representative for the impact of the chemical on the impedance of the electrolytic solution.

Abstract: The present disclosure is related to a method for determining time to failure characteristics of a microelectronics device. A test structure, being a parallel connection of a plurality of such on-chip interconnects, is provided. Measurements are performed on the test structure under test conditions for current density and temperature. The test structure is arranged such that failure of one of the on-chip interconnects within the parallel connection changes the test conditions for at least one of the other individual on-chip interconnects of the parallel connection. From these measurements, time to failure characteristics are determined, whereby the change in the test conditions is compensated for.

Abstract: The invention relates to an N-bit digital-to-analogue converter (DAC) system, comprising—a DAC unit comprising an N-bit master DAC and a slave DAC, yielding a master DAC unit output signal and a slave DAC unit output signal, respectively, said N-bit master DAC having an output step size,—an adder unit combining the master DAC unit output signal and the slave DAC unit output signal, and—a means for storing correction values for at least the master DAC, said correction values being used by the slave DAC, whereby the DAC system is arranged for master DAC output corrections with a size in absolute value higher than half of the output step size.

Abstract: The invention relates to an N-bit digital-to-analogue converter (DAC) system, comprising—a DAC unit comprising an N-bit master DAC and a slave DAC, yielding a master DAC unit output signal and a slave DAC unit output signal, respectively, said N-bit master DAC having an output step size,—an adder unit combining the master DAC unit output signal and the slave DAC unit output signal, and—a means for storing correction values for at least the master DAC, said correction values being used by the slave DAC, whereby the DAC system is arranged for master DAC output corrections with a size in absolute value higher than half of the output step size.

Abstract: The present disclosure is related to a method for determining time to failure characteristics of a microelectronics device. A test structure, being a parallel connection of a plurality of such on-chip interconnects, is provided. Measurements are performed on the test structure under test conditions for current density and temperature. The test structure is arranged such that failure of one of the on-chip interconnects within the parallel connection changes the test conditions for at least one of the other individual on-chip interconnects of the parallel connection. From these measurements, time to failure characteristics are determined, whereby the change in the test conditions is compensated for.

Abstract: A method for measuring resistance changes is described to study electromigration induced failures in conductive patterns. This method can provide a basis for lifetime predictions based on low value failure criteria, i.e. small resistance changes in the conductive patterns in a limited period of time. Two essentially identical so-called test and reference structures are placed close to each other on the same substrate and submitted to at least one sequence of a stress period and a measurement period. During a stress period, a DC current with a high current density is applied to the test structure thereby enhancing electromigration, while substantially simultaneous an AC current is applied to the reference structure leading to the same amount of power dissipation in said reference structure as the amount of power dissipation in said test structure, introduced by said DC stress current.

Abstract: An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured. The temperature coefficient is used to correct the measured parameter data and enhance its stability.

Abstract: An apparatus and method for measuring a parameter of a sample or component at a measurement temperature, wherein the parameter and the measurement temperature are measured at substantially the same time. A temperature coefficient of the sample or component is also established by using temperature fluctuations measured at or near the sample at the time at which the parameter is measured. The temperature coefficient is used to correct the measured parameter data and enhance its stability.