Patents by Inventor Warren James Leslie

Warren James Leslie has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect resolution methodology and target assessment process with a software system
    Patent number: 7917897
    Abstract: Embodiments of the invention are generally related to computer systems, and more specifically to the analysis of defects in computer software products. Defects uncovered during software testing may be stored in a data structure as data defects, code defects, or environment defects, along with further data describing a particular nature of the defects. The defects may be analyzed to determine a particular problem area causing the defects. If a particular class of defects is determined to be the dominant class of defects encountered during testing, an analysis path of that class of defects may be followed to determine a cause for the defects in the respective class. Therefore, corrective measures tailored to resolving the defects associated with the determined cause may be taken.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: March 29, 2011
    Assignee: International Business Machines Corporation
    Inventors: Kathryn Allyn Bassin, Brian Richard Lepel, Warren James Leslie, Susan Eileen Skrabanek, Crystal Faye Springer, Nathan Gary Steffenhagen
  • Defect Resolution Methodology Target Assessment Process
    Publication number: 20080201611
    Abstract: Embodiments of the invention are generally related to computer systems, and more specifically to the analysis of defects in computer software products. Defects uncovered during software testing may be stored in a data structure as data defects, code defects, or environment defects, along with further data describing a particular nature of the defects. The defects may be analyzed to determine a particular problem area causing the defects. If a particular class of defects is determined to be the dominant class of defects encountered during testing, an analysis path of that class of defects may be followed to determine a cause for the defects in the respective class. Therefore, corrective measures tailored to resolving the defects associated with the determined cause may be taken.
    Type: Application
    Filed: February 16, 2007
    Publication date: August 21, 2008
    Inventors: Kathryn Allyn Bassin, Brian Richard Lepel, Warren James Leslie, Susan Eileen Skrabanek, Crystal Faye Springer, Nathan Gary Steffenhagen