Patents by Inventor Wataru Akahane

Wataru Akahane has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110052448
    Abstract: The present invention discloses a method for measuring an amount of an objective component to be measured in a sample, which comprises; preventing an electric charge in an atmosphere in a photometry chamber from transferring to the surface of a solution which generates light due to an energy variation of a substance induced by the objective component in the sample, measuring value of the light, and determining an amount of the objective component in the sample on the basis of the measured value thus obtained, and an instrument used for the method. According to the present invention, in measurement of an objective component in a sample using a spectrophotometer, problems such as between-day variation of signal values or increase of background value, etc. can be solved, and a trace component can be measured in high accuracy and high sensitivity.
    Type: Application
    Filed: July 28, 2010
    Publication date: March 3, 2011
    Applicant: WAKO PURE CHEMICAL INDUSTRIES, LTD.
    Inventors: Takashi FUJITA, Sachiko YAMAMOTO, Hiroyuki YAMADA, Wataru AKAHANE
  • Patent number: 7795034
    Abstract: The present invention discloses a method for measuring an amount of an objective component to be measured in a sample, which comprises; preventing an electric charge in an atmosphere in a photometry chamber from transferring to the surface of a solution which generates light due to an energy variation of a substance induced by the objective component in the sample, measuring value of the light, and determining an amount of the objective component in the sample on the basis of the measured value thus obtained, and an instrument used for the method. According to the present invention, in measurement of an objective component in a sample using a spectrophotometer, problems such as between-day variation of signal values or increase of background value, etc. can be solved, and a trace component can be measured in high accuracy and high sensitivity.
    Type: Grant
    Filed: June 21, 2004
    Date of Patent: September 14, 2010
    Assignee: Wako Pure Chemical Industries, Ltd.
    Inventors: Takashi Fujita, Sachiko Yamamoto, Hiroyuki Yamada, Wataru Akahane
  • Patent number: 7785892
    Abstract: The present invention discloses a method of measuring iron concentration in a sample. The method includes bringing iron contained in the sample into contact with a metallochromic indicator for iron in the presence of lithium ion and determining the iron concentration based on the degree of resultant coloring. The present disclosure further includes a reagent and a kit using therefor.
    Type: Grant
    Filed: May 9, 2006
    Date of Patent: August 31, 2010
    Assignee: Wako Pure Chemical Industries, Ltd.
    Inventors: Wataru Akahane, Haruhisa Ijiri, Toshiro Hanada
  • Publication number: 20090068750
    Abstract: The present invention discloses a method of measuring iron concentration in a sample, characterized by bringing the iron contained in the sample into contact with a metallochromic indicator for iron in the presence of lithium ion and determining the iron concentration based on the degree of resultant coloring, a reagent and a kit using therefor.
    Type: Application
    Filed: May 9, 2006
    Publication date: March 12, 2009
    Applicant: WAKO PURE CHEMICAL INDUSTRIES, LTD.
    Inventors: Wataru Akahane, Haruhisa Ijiri, Toshiro Hanada
  • Publication number: 20060170914
    Abstract: The present invention discloses a method for measuring an amount of an objective component to be measured in a sample, which comprises; preventing an electric charge in an atmosphere in a photometry chamber from transferring to the surface of a solution which generates light due to an energy variation of a substance induced by the objective component in the sample, measuring value of the light, and determining an amount of the objective component in the sample on the basis of the measured value thus obtained, and an instrument used for the method. According to the present invention, in measurement of an objective component in a sample using a spectrophotometer, problems such as between-day variation of signal values or increase of background value, etc. can be solved, and a trace component can be measured in high accuracy and high sensitivity.
    Type: Application
    Filed: June 21, 2004
    Publication date: August 3, 2006
    Applicant: WAKO PURE CHEMICAL INDUSTRIES, LTD.
    Inventors: Takashi Fujita, Sachiko Yamamoto, Hiroyuki Yamada, Wataru Akahane