Patents by Inventor Wayne B. Williams

Wayne B. Williams has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Generated set top calibration patterns in manufacturing
    Patent number: 8295338
    Abstract: Included are systems and methods for performing an internal operations test to a set top terminal (STT). At least one embodiment of a method includes creating a test pattern for testing video functionality of the STT, sending the created test pattern to a digital encoder, and converting the test pattern to an analog signal.
    Type: Grant
    Filed: June 10, 2011
    Date of Patent: October 23, 2012
    Inventors: Leo Montreuil, Wayne B. Williams, Samuel H. Russ, Robert A. Kriete
  • GENERATED SET TOP CALIBRATION PATTERNS IN MANUFACTURING
    Publication number: 20110234810
    Abstract: Included are systems and methods for performing an internal operations test to a set top terminal (STT). At least one embodiment of a method includes creating a test pattern for testing video functionality of the STT, sending the created test pattern to a digital encoder, and converting the test pattern to an analog signal.
    Type: Application
    Filed: June 10, 2011
    Publication date: September 29, 2011
    Applicant: Scientific-Atlanta, LLC
    Inventors: Leo Montreuil, Wayne B. Williams, Samuel H. Russ, Robert A. Kriete
  • Generated set top calibration patterns in manufacturing
    Patent number: 7961780
    Abstract: Included are systems and methods for performing an internal operations test to a set top terminal (STT). At least one embodiment of a method includes creating a test pattern for testing video functionality of the STT, sending the created test pattern to a digital encoder, and converting the test pattern to an analog signal.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: June 14, 2011
    Inventors: Leo Montreuil, Wayne B. Williams, Samuel H. Russ, Robert A. Kriete
  • Analog set top calibration patterns in manufacturing
    Patent number: 7499822
    Abstract: Included are systems and methods for performing a functionality test to an STT. At least one embodiment of a method includes storing at least one test pattern in a storage device, decoding the at least one stored test pattern, and sending the test pattern from a output port to an input port, the input port being coupled to at least one tuning device. Other embodiments include tuning, via the at least one tuning device, the STT according to the test pattern and converting the decoded test pattern to at least one output signal.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: March 3, 2009
    Assignee: Cisco Technology, Inc.
    Inventors: Leo Montreuil, Wayne B. Williams, Samuel H. Russ, Robert A. Kriete
  • Set Top Calibration Patterns in Manufacturing
    Publication number: 20080022338
    Abstract: Included are systems and methods for testing functionality of a set top terminal (STT). At least one embodiment of a method includes retrieving a test pattern from a storage device, the test pattern being configured to facilitate testing of at least one component of the STT, decoding the retrieved test pattern, and converting the decoded test pattern to at least one analog signal.
    Type: Application
    Filed: June 29, 2006
    Publication date: January 24, 2008
    Applicant: SCIENTIFIC-ATLANTA, INC.
    Inventors: Leo Montreuil, Wayne B. Williams, Samuel H. Russ, Robert A. Kriete
  • Generated Set Top Calibration Patterns in Manufacturing
    Publication number: 20080022339
    Abstract: Included are systems and methods for performing an internal operations test to a set top terminal (STT). At least one embodiment of a method includes creating a test pattern for testing video functionality of the STT, sending the created test pattern to a digital encoder, and converting the test pattern to an analog signal.
    Type: Application
    Filed: June 29, 2006
    Publication date: January 24, 2008
    Applicant: SCIENTIFIC-ATLANTA, INC.
    Inventors: Leo Montreuil, Wayne B. Williams, Samuel H. Russ, Robert A. Kriete
  • Analog Set Top Calibration Patterns in Manufacturing
    Publication number: 20080004830
    Abstract: Included are systems and methods for performing a functionality test to an STT. At least one embodiment of a method includes storing at least one test pattern in a storage device, decoding the at least one stored test pattern, and sending the test pattern from a output port to an input port, the input port being coupled to at least one tuning device. Other embodiments include tuning, via the at least one tuning device, the STT according to the test pattern and converting the decoded test pattern to at least one output signal.
    Type: Application
    Filed: June 29, 2006
    Publication date: January 3, 2008
    Applicant: SCIENTIFIC-ATLANTA, INC.
    Inventors: Leo Montreuil, Wayne B. Williams, Samuel H. Russ, Robert A. Kriete