Patents by Inventor Wayne Batt

Wayne Batt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Output impedance calibration circuit with multiple output driver models
    Patent number: 8049530
    Abstract: A method and circuitry for calibration of the output impedance of output driver circuits in an integrated circuit is disclosed. The output drivers within an area on the integrated circuit are defined as a group, and an output model indicative of the operation of the output drivers and used to calibrate their output impedances is provided proximate to the output drivers. A state machine is used to query each output model, and to set the proper output enable signals for the enable transistors in the output drivers in each group so as to calibrate their output impedances. By decentralizing the output models, the process used to form the output models will, due to proximity to the output drivers in each group, be indicative of the process used to form the output drivers. Thus, when each group of output drivers is calibrated, the output models used for each will compensate for process variations as may occur across the surface of the integrated circuit.
    Type: Grant
    Filed: April 16, 2009
    Date of Patent: November 1, 2011
    Assignee: Round Rock Research, LLC
    Inventor: Wayne Batt
  • Output impedance calibration circuit with multiple output driver models
    Patent number: 7535250
    Abstract: A method and circuitry for calibration of the output impedance of output driver circuits in an integrated circuit is disclosed. The output drivers within an area on the integrated circuit are defined as a group, and an output model indicative of the operation of the output drivers and used to calibrate their output impedances is provided proximate to the output drivers. A state machine is used to query each output model, and to set the proper output enable signals for the enable transistors in the output drivers in each group so as to calibrate their output impedances. By decentralizing the output models, the process used to form the output models will, due to proximity to the output drivers in each group, be indicative of the process used to form the output drivers. Thus, when each group of output drivers is calibrated, the output models used for each will compensate for process variations as may occur across the surface of the integrated circuit.
    Type: Grant
    Filed: August 22, 2005
    Date of Patent: May 19, 2009
    Assignee: Micron Technology, Inc.
    Inventor: Wayne Batt
  • Output impedance calibration circuit with multiple output driver models
    Publication number: 20070040573
    Abstract: A method and circuitry for calibration of the output impedance of output driver circuits in an integrated circuit is disclosed. The output drivers within an area on the integrated circuit are defined as a group, and an output model indicative of the operation of the output drivers and used to calibrate their output impedances is provided proximate to the output drivers. A state machine is used to query each output model, and to set the proper output enable signals for the enable transistors in the output drivers in each group so as to calibrate their output impedances. By decentralizing the output models, the process used to form the output models will, due to proximity to the output drivers in each group, be indicative of the process used to form the output drivers. Thus, when each group of output drivers is calibrated, the output models used for each will compensate for process variations as may occur across the surface of the integrated circuit.
    Type: Application
    Filed: August 22, 2005
    Publication date: February 22, 2007
    Applicant: Micron Technology, Inc.
    Inventor: Wayne Batt