Abstract: A cleaning element and a method for utilizing the cleaning element within a semiconductor testing procedure may improve the efficiency of testing semiconductor wafers or chips by eliminating the need for personnel to manually and visually inspect cleaning elements when worn out. The cleaning element may be impregnated with conductive particles that lower the conductivity of the cleaning element to a degree which can be measured by the same probe card which tests the wafers. As the cleaning element is worn by usage in cleaning the probe tips, the conductivity will increase. The testing process using the probe card will periodically pause testing procedure, both to be cleaned by the cleaning element, and also to test the conductivity of the cleaning element.

Abstract: A Medical electrode is disclosed. It comprises a conductive adhesive, such as a polymer adhesive, that can switch from a high attachment phase to a low attachment phase when exposed to an initiator. The initiator can be electrical, chemical, mechanical, or photolytic in nature. The ability to switch phases allows the adhesiveness of the electrode to be changed depending upon whether the electrode is being attached to a patient, whether the electrode is operational, or whether the electrode is being detached. Use of such materials can allow less glue residue to be left by the electrodes, which allows for easier cleanup and in some cases much less painful electrode removal.

Abstract: A system for leveling and distance-measuring, the system including a housing, a self-leveling-laser fixed to the housing, an electronic-stud-finder also fixed to the housing, a distance-measurer having distance-measuring-circuitry, a display detachably coupled to the housing, and an audio-output including variable-frequency-output and variable-tone-output. The system for leveling and distance-measuring also includes at least one mode-selector-switch, configured to select a mode-of-operation of the system from at least a leveling mode and a distance-measuring mode. The system is structured and arranged to determine level, plumb, measure distances, locate studs embedded within walls, and measure a width of the studs.