Abstract: A system can include a device under test (DUT) having a DUT voltage, a cable connected to the DUT, the cable having a cable inductance, and a power supply configured as a current source to provide a wide bandwidth voltage source to the DUT, wherein the DUT voltage is independent of the cable inductance.

Abstract: A system may include two input terminals, e.g., HI and LO, and a floating circuit that is physically separate from the input terminals and includes a gain amplifier. The floating circuit can be surrounded by a conductive enclosure that is electrically connected to the second input terminal. The floating circuit can further switch between input signals received from the first and second input terminals to the gain amplifier and the floating circuit ground.

Abstract: A device with low dielectric absorption includes a printed circuit board (PCB), a component connection area including a first conductor layered on a top surface of the component connection area and a second conductor layered on a bottom surface of the component connection area, an aperture surrounding the component connection area, a low-leakage component connecting the component connection area to the PCB across the aperture, and a guard composed of a third conductor at least substantially surrounding the aperture on a top surface of the PCB and a fourth conductor at least substantially surrounding the aperture on a bottom surface of the PCB.

Abstract: A device with low dielectric absorption includes a printed circuit board (PCB), a component connection area including a first conductor layered on a top surface of the component connection area and a second conductor layered on a bottom surface of the component connection area, an aperture surrounding the component connection area, a low-leakage component connecting the component connection area to the PCB across the aperture, and a guard composed of a third conductor at least substantially surrounding the aperture on a top surface of the PCB and a fourth conductor at least substantially surrounding the aperture on a bottom surface of the PCB.

Abstract: A system can include a device under test (DUT) having a DUT voltage, a cable connected to the DUT, the cable having a cable inductance, and a power supply configured as a current source to provide a wide bandwidth voltage source to the DUT, wherein the DUT voltage is independent of the cable inductance.

Abstract: A system may include two input terminals, e.g., HI and LO, and a floating circuit that is physically separate from the input terminals and includes a gain amplifier. The floating circuit can be surrounded by a conductive enclosure that is electrically connected to the second input terminal. The floating circuit can further switch between input signals received from the first and second input terminals to the gain amplifier and the floating circuit ground.

Abstract: A connection system for connecting test equipment to a device under test (DUT) includes a first pair of equal-length triaxial cables, each having a desired characteristic impedance between a center conductor and an outer conductor, the outer conductor of each first cable being connected to each other at respective proximal and distal ends of the first cables, the distal end of each first cable center conductor being connected to each other, and the distal end of each of a first cable intermediate conductor being connected to each other; and a second pair of equal-length triaxial cables, each having the desired characteristic impedance between a center conductor and an outer conductor, the outer conductor of each second cable being connected to each other at respective proximal and distal ends of the second cables as well as to the respective proximal and distal ends of the outer conductors of the first cables, the distal end of each second cable center conductor being connected to each other, and the distal e

Abstract: A range-changing circuit includes an array of graduated impedances in serial relationship, and a voltage sensing and limiting switch across one of said impedances. The switch limits the voltage across said one of the impedances in response to a voltage sensed by the switch.

Abstract: A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device, an error amplifier selectable to control the controlled current or voltage, the error amplifier providing an error signal for the control, and a floating buffer driving the series combination in response to the error signal.

Abstract: A printed circuit board transformer has primary and secondary windings. The transformer includes a printed circuit board having a plurality of traces forming a plurality of first portions of the primary and secondary windings, an annular magnetic core adjacent to the printed circuit board, and a plurality of second portions of the primary and secondary windings. The second portions are formed from conductors enlacing the core.

Abstract: A power supply is provided with independently adjustable voltage and current sources to provide a power supply having a desired voltage-current relationship to a device under test. This allows the control of the power supply output impedance as seen by the device under test and the emulation of a battery or other power supply having particular voltage-current relationships.

Abstract: A contact resistance check circuit and method for verifying that a sufficient electrical connection is established between a source and a sense lead of a Kelvin connection. The circuit includes a microprocessor for driving a transformer that is connected to the source/sense probe (i.e., contact resistance) with an input pulse. The input pulse is altered in relation to the magnitude of the contact resistance to produce a check pulse. A comparator is used to compare the check pulse with a threshold voltage and for generating a fault indication signal. A flip flop then stores the fault indication signal so that the fault indication signal may be monitored by the microprocessor.

Abstract: A contact resistance check circuit and method for verifying that a sufficient electrical connection is established between a source and a sense lead of a Kelvin connection. The circuit includes a microprocessor for driving a transformer that is connected to the source/sense probe (i.e., contact resistance) with an input pulse. The input pulse is altered in relation to the magnitude of the contact resistance to produce a check pulse. A comparator is used to compare the check pulse with a threshold voltage and for generating a fault indication signal. A flip flop then stores the fault indication signal so that the fault indication signal may be monitored by the microprocessor.