Patents by Inventor Wayne M. Clift

Wayne M. Clift has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7740916
    Abstract: A coating for the protection of optical surfaces exposed to a high energy erosive plasma. A gas that can be decomposed by the high energy plasma, such as the xenon plasma used for extreme ultraviolet lithography (EUVL), is injected into the EUVL machine. The decomposition products coat the optical surfaces with a protective coating maintained at less than about 100 ? thick by periodic injections of the gas. Gases that can be used include hydrocarbon gases, particularly methane, PH3 and H2S. The use of PH3 and H2S is particularly advantageous since films of the plasma-induced decomposition products S and P cannot grow to greater than 10 ? thick in a vacuum atmosphere such as found in an EUVL machine.
    Type: Grant
    Filed: April 5, 2004
    Date of Patent: June 22, 2010
    Assignee: EUV LLC.
    Inventors: Philip A. Grunow, Wayne M. Clift, Leonard E. Klebanoff
  • Publication number: 20100124723
    Abstract: A coating for the protection of optical surfaces exposed to a high energy erosive plasma. A gas that can be decomposed by the high energy plasma, such as the xenon plasma used for extreme ultraviolet lithography (EUVL), is injected into the EUVL machine. The decomposition products coat the optical surfaces with a protective coating maintained at less than about 100 ? thick by periodic injections of the gas. Gases that can be used include hydrocarbon gases, particularly methane, PH3 and H2S. The use of PH3 and H2S is particularly advantageous since films of the plasma-induced decomposition products S and P cannot grow to greater than 10 ? thick in a vacuum atmosphere such as found in an EUVL machine.
    Type: Application
    Filed: April 5, 2004
    Publication date: May 20, 2010
    Inventors: Philip A. Grunow, Wayne M. Clift, Leonard E. Klebanoff