Patents by Inventor Wayne M. Wilburn

Wayne M. Wilburn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Wide range compensation of low frequency response passive probe
    Patent number: 10585118
    Abstract: Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.
    Type: Grant
    Filed: September 29, 2017
    Date of Patent: March 10, 2020
    Assignee: Tektronix, Inc.
    Inventors: Michael J. Mende, Richard A. Booman, Wayne M. Wilburn
  • Dynamic output clamping for a probe or accessory
    Patent number: 10514394
    Abstract: A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.
    Type: Grant
    Filed: September 16, 2016
    Date of Patent: December 24, 2019
    Assignee: Tektronix, Inc.
    Inventors: Michael J. Mende, Richard A. Booman, Wayne M. Wilburn
  • Wide Range Compensation of Low Frequency Response Passive Probe
    Publication number: 20180328961
    Abstract: Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.
    Type: Application
    Filed: September 29, 2017
    Publication date: November 15, 2018
    Applicant: Tektronix, Inc.
    Inventors: Michael J. Mende, Richard A. Booman, Wayne M. Wilburn
  • DYNAMIC OUTPUT CLAMPING FOR A PROBE OR ACCESSORY
    Publication number: 20170248631
    Abstract: A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.
    Type: Application
    Filed: September 16, 2016
    Publication date: August 31, 2017
    Inventors: Michael J. Mende, Richard A. Booman, Wayne M. Wilburn