Abstract: Aspects of the present disclosure provide for a system. In some examples, the system includes a computing device configured to capture an image depicting dental characteristics of an animal and a server. The server is configured to receive the image from the computing device, determine a plurality of teeth depicted in the image, determine at least one feature associated with at least one of the plurality of teeth, determine an estimate age of the animal based at least partially on the determined plurality of teeth and the at least one feature, and provide the estimated age of the animal.

Abstract: Aspects of the present disclosure provide for a system. In some examples, the system includes a computing device configured to capture an image depicting dental characteristics of an animal and a server. The server is configured to receive the image from the computing device, determine a plurality of teeth depicted in the image, determine at least one feature associated with at least one of the plurality of teeth, determine an estimate age of the animal based at least partially on the determined plurality of teeth and the at least one feature, and provide the estimated age of the animal.

Abstract: A testing methodology for very large scale integrated circuits, for example, microprocessors having several million transistors. Initially a set of pseudorandom test patterns is selected. During the design of the integrated circuit it is partitioned into functional units and each unit is designed to be verified and tested by the test patterns. During a test mode all of the units of the integrated circuit receives the test patterns in parallel. The output from each unit is coupled to a signature register. The contents of the signature registers are examined following application of the test pattern. This testing methodology lends itself to the simultaneous testing of many integrated circuits.

Abstract: A method and an apparatus for sensing quiescent current in a CMOS integrated circuit. The present invention utilizes circuitry which is not series coupled to the CMOS integrated circuit under test. The quiescent current, commonly referred to as I.sub.DDQ, flows through the supply line during the quiescent state of the CMOS integrated circuit. A magnetic field sensor is located on the substrate near the supply line of the CMOS integrated circuit. The magnetic field sensor detects the magnetic field generated from the supply line by I.sub.DDQ. The magnetic field sensor is coupled to output circuitry located on the substrate which produces a measurement result calibrated to indicate when I.sub.DDQ has a predetermined value.