Abstract: A system for determining and quantifying specific trace elements in samples of complex materials has a laser ablation (LA) apparatus (1) coupled to a Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR-MS) (2) with a mass range of at least 2 to 300 amu and a mass resolution of at least 8000 for 300 amu.

Abstract: A system, method, and device for providing remote mass spectrometry are disclosed. The exemplary system may have an ion source for injecting ions and a measurement chamber. The measurement chamber may be coupled to the ion source for receiving and detecting signals of the ions. The measurement chamber may have an analysis cell, a magnet and an ionizing device. A control board may be in communication with the measurement chamber. The control board may receive signals received and detected by the measurement chamber. The control board may be located remotely and may have a processor for analyzing the signal.