Abstract: A nonvolatile memory comprising an array of memory cells and sense amplifiers, each sense amplifier using a keeper circuit to provide an amount of current to compensate for bit line leakage current in the memory array. The amount of current from the keeper depends on the temperature of the memory and the speed of the process used to make the memory.

Abstract: A nonvolatile memory comprising an array of memory cells and sense amplifiers, each sense amplifier using a keeper circuit to provide an amount of current to compensate for bit line leakage current in the memory array. The amount of current from the keeper depends on the temperature of the memory and the speed of the process used to make the memory.

Abstract: A nonvolatile memory comprising an array of memory cells and sense amplifiers, each sense amplifier using a keeper circuit to provide an amount of current to compensate for bit line leakage current in the memory array. The amount of current from the keeper depends on the temperature of the memory and the speed of the process used to make the memory.

Abstract: A nonvolatile memory comprising an array of memory cells and sense amplifiers, each sense amplifier using a keeper circuit to provide an amount of current to compensate for bit line leakage current in the memory array. The amount of current from the keeper depends on the temperature of the memory and the speed of the process used to make the memory.

Abstract: An integrated circuit includes memory circuitry with a number of bit line structures, each including at least three bit lines; a number of word lines that intersect with the bit line structures at a number of sites; and a number of switching devices located at the sites. A number of VSS planes are interconnected with the switching devices. The switching devices and the VSS planes are formed at a first level. The VSS planes can be formed as substantially complementary interlocking regions that also form functional portions of the switching devices. The switching devices can be connected between an adjacent one of the word lines and a selected one of the bit lines of an adjacent one of the bit line structures for selective electrical conduction therebetween upon activation by the adjacent one of the word lines.

Abstract: A memory circuit includes a number of bit line structures, each including at least three bit lines; a number of word lines that intersect with the bit line structures at a number of sites; and a number of switching devices located at the sites. A number of column sense logic units are also provided, corresponding to the bit line structures. Each of the column sense logic units includes a first logic gate and a second logic gate. The first logic gate has a first input connected with a first one of the bit lines and a second input connected with a second one of the bit lines. The second logic gate has a first input interconnected with a third one of the bit lines, and a second input interconnected with the second one of the bit lines.