Patents by Inventor Wee Lang Tan

Wee Lang Tan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test structure of semiconductor device
    Patent number: 7317204
    Abstract: A test structure of a semiconductor device is provided. The test structure includes a semiconductor substrate, a transistor which includes a gate electrode formed on first and second active regions defined within the semiconductor substrate, and first and second junction regions which are arranged at both sidewalls of the gate electrode to reside within the first and second active regions and are silicided, and first and second pads through which electrical signals are applied to the silicided first and second junction regions and detected and which are formed on the same level as the gate electrode or the semiconductor substrate.
    Type: Grant
    Filed: September 2, 2005
    Date of Patent: January 8, 2008
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Min-chul Sun, Ja-hum Ku, Brian J. Greene, Manfred Eller, Wee Lang Tan, Sunfei Fang, Zhijiong Luo