Abstract: A testing apparatus for integrated circuits (ICs) that includes a printed circuit board (PCB) incorporating a test circuit is provided. The testing apparatus includes an insulating support structure and multiple conductive pillars. The insulating support structure features several through-holes designed to accommodate the conductive pillars. The conductive pillars are partially embedded within the insulating support structure and extend through the through-holes to establish electrical connections for IC testing. These conductive pillars possess elasticity, enabling them to adapt to various sizes and shapes of ICs. The insulating support structure includes multiple grooves adjacent to the through-holes, wherein portions of the conductive pillars are embedded to enhance their secure attachment to the insulating support structure. The testing apparatus also includes an isolation layer located adjacent to the conductive pillars to prevent the pillars from contacting each other and causing short circuits.

Abstract: A test socket for integrated circuit (IC) testing is provided and comprises an insulating support structure and multiple conductive columns. The insulating support structure features multiple through-holes designed to accommodate the conductive columns. Parts of the conductive columns are embedded within the insulating support structure and extend through these through-holes to establish electrical connections for IC testing. The conductive columns are elastic, allowing them to accommodate variations caused by warpage of the IC packaging and the tolerances in BGA solder ball sizes. Additionally, the insulating support structure incorporates multiple grooves located next to the through-holes, where parts of the conductive columns are embedded, enhancing the fixation strength of the conductive columns to the insulating support structure.

Abstract: A method is provided for modifying a circuit containing a plurality of electrodes, within a substrate, comprising the steps of: (a) selecting at least two electrodes for making a connection; (b) removing materials covering the electrodes with a focused ion beam (FIB) or a laser to form contact holes for respectively exposing the electrodes; (c) depositing in the contact holes a conductive material for forming electrically conductive piers, by applying the focused ion beam (FIB) or laser, with gas molecules ejected from a nozzle; (d) disposing an electrically conductive viscid material over each of the electrically conductive piers; and (e) disposing an electrically conductive bridge floor to connect with the electrically conductive viscid material to form an electrically conductive bridge.

Abstract: The present invention relates to a method for modifying a circuit within a substrate, and the circuit includes a plurality of electrodes. The method includes: (a) selecting at least two from the plurality of electrodes for making connection; (b) removing materials covering said selected electrodes with a focused ion beam (FIB) or a laser to form contact holes for respectively exposing said selected electrodes; (c) depositing in said contact holes a conductive material for forming electrically conductive piers by applying said focused ion beam (FIB) or a laser with gas molecules ejected from a nozzle; (d) disposing an electrically conductive viscid material over each of said electrically conductive piers; and (e) disposing an electrically conductive bridge floor to connect with each of the electrically conductive viscid material to form an electrically conductive bridge.

Abstract: The present invention relates to a method for retrieving a signal from a circuit within a substrate. The method comprising steps of: (a) selecting at least one from the plurality of electrodes for signal retrieving; (b) removing materials covering said selected electrode with a focused ion beam (FIB) or a laser to form contact hole for exposing said selected electrode; (c) depositing in said contact hole a conductive material for forming electrically conductive pier by applying said focused ion beam (FIB) or a laser over gas molecules; (d) disposing an electrically conductive viscid material over each electrically conductive pier; and (e) connecting the electrically conductive viscid material with a conductive wire. Thus, the signal could be retrieved from the electrically conductive wire.