Patents by Inventor Wei-Chen Wu

Wei-Chen Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250210756
    Abstract: An immersed cooled battery module includes a battery tank, battery cells, and a modular panel. The battery tank includes an outer tank and an inner tank. The inner tank is arranged in the outer tank. The inner tank has an opening connecting to the inner tank and the outer tank. The battery cells are arranged in the inner tank. The modular panel is installed on one side of the outer tank. The modular panel has a liquid inlet and a liquid outlet. The liquid inlet is connected to the inner tank. The liquid outlet is connected to the outer tank. A coolant enters the inner tank from the liquid inlet, then overflows to the outer tank through the opening, and finally discharges from the liquid outlet to complete the circulation of the coolant.
    Type: Application
    Filed: February 6, 2024
    Publication date: June 26, 2025
    Applicant: ETI CA BATTERY INC.
    Inventor: Wei-Chen WU
  • Patent number: 12276580
    Abstract: A pump health analysis method and a pump health analysis device using the same are provided. A standard vibration curve of a standard pump is obtained. The standard vibration curve is converted from a time domain to a frequency domain to obtain a first frequency distribution curve. A sample vibration curve of a sample pump is obtained. The sample vibration curve is converted from the time domain to the frequency domain to obtain a second frequency distribution curve. The first frequency distribution curve is compared with the second frequency distribution curve by using a cosine similarity algorithm to obtain a health index of the sample pump.
    Type: Grant
    Filed: November 9, 2022
    Date of Patent: April 15, 2025
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Wei-Chen Wu, Cheng-Tai Peng, Chih-Chung Kuo
  • Publication number: 20250103770
    Abstract: An end-to-end design method for designing a free-form surface system comprises: S1, providing an initial plane system, solving a first-order geometric structure according to the initial plane system, the first-order geometric structure comprising multiple curved surfaces, and determining an optical focal length of each curved surface according to a field curvature equation and the focal length equation; S2, determining the optical focal length of each curved surface and adjusting the position of the curved surface using a flat field condition and a linear astigmatism elimination equation; S3, determining a fast design strategy for the first-order geometric structure, a design strategy meets at least one of the following three conditions: a focal length of the system is equal to a given value; and S4, constructing the free-form surface system using a surface normal correction method.
    Type: Application
    Filed: September 19, 2024
    Publication date: March 27, 2025
    Inventors: JUN ZHU, WEI-CHEN WU, MENG-HUI WANG
  • Publication number: 20240152193
    Abstract: The invention provides a power supply including at least one power output port, at least one status alert component, and at least one output port status monitoring module. The status alert component generates at least one visual prompt based on an alert signal. The output port status monitoring module includes at least one temperature sensor adjacent to the power output port, a microcontroller connected to the temperature sensor and sensing an output current from the power output port, and a reset signal generator connected to the microcontroller. The microcontroller comprises at least one port status alert condition that takes a temperature and the output current of the power output port as decision factors. The microcontroller outputs the alert signal to the status alert component when the port status alert condition is met and maintains the status until a reset signal provided by the reset signal generator is received.
    Type: Application
    Filed: November 4, 2022
    Publication date: May 9, 2024
    Inventors: Wei-Chen WU, Wen-Hau HU, Hung-Wei YANG, Cheng-Yung LO, Yu-Hao SU, Jian-Zhi HUANG
  • Publication number: 20240144467
    Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.
    Type: Application
    Filed: January 8, 2024
    Publication date: May 2, 2024
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung, Kuang-Shing Chen, Li-Jou Lee, Yung-Cheng Lin, Wei-Chen Wu, Shih-Chang Wang, Chien-An Lin
  • Publication number: 20240094094
    Abstract: A pump health analysis method and a pump health analysis device using the same are provided. A standard vibration curve of a standard pump is obtained. The standard vibration curve is converted from a time domain to a frequency domain to obtain a first frequency distribution curve. A sample vibration curve of a sample pump is obtained. The sample vibration curve is converted from the time domain to the frequency domain to obtain a second frequency distribution curve. The first frequency distribution curve is compared with the second frequency distribution curve by using a cosine similarity algorithm to obtain a health index of the sample pump.
    Type: Application
    Filed: November 9, 2022
    Publication date: March 21, 2024
    Inventors: Wei-Chen WU, Cheng-Tai PENG, Chih-Chung KUO
  • Patent number: 11900586
    Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.
    Type: Grant
    Filed: December 15, 2020
    Date of Patent: February 13, 2024
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung, Kuang-Shing Chen, Li-Jou Lee, Yung-Cheng Lin, Wei-Chen Wu, Shih-Chang Wang, Chien-An Lin
  • Patent number: 11796796
    Abstract: The present application relates to an off-axis two-mirror infrared imaging system including a primary reflecting mirror and a secondary reflecting mirror. The primary reflecting mirror is located on the incident light path of an incident infrared light beam and reflects the incident infrared light beam to form a first reflected light beam. The secondary reflecting mirror is located on the reflection light path of the primary reflecting mirror, and is used to reflect the first reflected light beam to form a second reflected light beam. The second reflected light beam reaches an image surface after passing through the incident infrared light beam. The reflective surfaces of the primary reflecting mirror and the secondary reflecting mirror are freeform surfaces. The secondary reflecting mirror and the image plane are respectively located on both sides of the incident infrared light beam.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: October 24, 2023
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Wei-Chen Wu, Jun Zhu, Guo-Fan Jin, Shou-Shan Fan
  • Patent number: 11650402
    Abstract: A freeform surface off-axial three-mirror imaging system is provided. The freeform surface off-axial three-mirror imaging system comprises a primary mirror, a secondary mirror, and a compensating mirror. The primary mirror, the secondary mirror, and the compensating mirror are located adjacent and spaced away from each other. A surface shape of each of the primary mirror and the secondary mirror is a quadric surface. The primary mirror is used as an aperture stop. A surface shape of the compensating mirror is a freeform surface. A light emitted from a light source is reflected by the primary mirror, the secondary mirror, and the compensating mirror to form an image on an image plane.
    Type: Grant
    Filed: August 21, 2020
    Date of Patent: May 16, 2023
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Jun Zhu, Rui-rui Tang, Wei-Chen Wu, Guo-Fan Jin, Shou-Shan Fan
  • Patent number: 11635611
    Abstract: A freeform surface optical telescope imaging system is provided. The freeform surface optical telescope imaging system comprises a primary mirror, a secondary mirror, a compensating mirror, and a spherical mirror. The primary mirror, the secondary mirror, the compensating mirror, and the spherical mirror are spaced from each other. A surface shape of each of the primary mirror and the secondary mirror is a quadric surface. The primary mirror is used as an aperture stop. A surface shape of the compensating mirror is a freeform surface. A surface shape of the spherical mirror is a spherical surface. A light emitted from a light source would be reflected by the primary mirror, the secondary mirror, the compensating mirror, and the spherical mirror to form an image on an image plane.
    Type: Grant
    Filed: August 21, 2020
    Date of Patent: April 25, 2023
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Jun Zhu, Rui-rui Tang, Wei-Chen Wu, Guo-Fan Jin, Shou-Shan Fan
  • Patent number: 11564330
    Abstract: A fan control circuit for controlling at least one fan of a power supply device includes a load sensing unit, a temperature sensing unit, a control unit connected to the load sensing unit, the temperature sensing unit and the fan, and a mode switching unit. The load sensing unit generates a load signal according to an output condition of the power supply device. The temperature sensing unit senses the temperature in the power supply device and generates a temperature signal. The control unit comprises a low-speed operating mode for controlling the fan according to the load signal, a mute mode for controlling the fan according to the temperature signal, and a full-speed operating mode for controlling the fan to run in a rated rotational speed. The mode switching unit controls the control unit to adjust the rotational speed of the fan by one of the three modes.
    Type: Grant
    Filed: May 13, 2020
    Date of Patent: January 24, 2023
    Assignee: SEA SONIC ELECTRONICS CO., LTD.
    Inventor: Wei-Chen Wu
  • Patent number: 11371889
    Abstract: The present invention relates to a freeform surface reflective infrared imaging system comprising a primary mirror, a secondary mirror, a tertiary mirror, and an infrared light detector. Each reflective surface of the primary mirror, the secondary mirror, and the tertiary mirror is an xy polynomial freeform surface. A field of view of the freeform surface reflective infrared imaging system is larger than or equal to 40°×30°. An F-number of the freeform surface reflective infrared imaging system is less than or equal to 1.39.
    Type: Grant
    Filed: June 29, 2020
    Date of Patent: June 28, 2022
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Wei-Chen Wu, Jun Zhu, Guo-Fan Jin, Shou-Shan Fan
  • Patent number: 11374529
    Abstract: The present invention provides a fan speed control method for avoiding inaccurate control caused by sudden changes in a power supply output state, including the steps of: acquiring an output current value of a power supply device; and then, determining a change of the output current value in a sampling timeframe, if a slope representing the change is positive, controlling the control signal generating unit to gradually replace the fan control signal currently output to the fan with another fan control signal on the basis of a first latency, and if the slope representing the change is negative, controlling the control signal generating unit to gradually replace the fan control signal currently output to the fan with another fan control signal on the basis of a second latency. The first latency and the second latency are determined by the output current value, respectively.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: June 28, 2022
    Assignee: SEA SONIC ELECTRONICS CO., LTD.
    Inventors: Sheng-Chien Chou, Hsiu-Cheng Chang, Wei-Chen Wu
  • Publication number: 20220131495
    Abstract: The present invention provides a fan speed control method for avoiding inaccurate control caused by sudden changes in a power supply output state, including the steps of: acquiring an output current value of a power supply device; and then, determining a change of the output current value in a sampling timeframe, if a slope representing the change is positive, controlling the control signal generating unit to gradually replace the fan control signal currently output to the fan with another fan control signal on the basis of a first latency, and if the slope representing the change is negative, controlling the control signal generating unit to gradually replace the fan control signal currently output to the fan with another fan control signal on the basis of a second latency. The first latency and the second latency are determined by the output current value, respectively.
    Type: Application
    Filed: October 22, 2020
    Publication date: April 28, 2022
    Inventors: Sheng-Chien CHOU, Hsiu-Cheng CHANG, Wei-Chen WU
  • Publication number: 20220050288
    Abstract: The present application relates to an off-axis two-mirror infrared imaging system including a primary reflecting mirror and a secondary reflecting mirror. The primary reflecting mirror is located on the incident light path of an incident infrared light beam and reflects the incident infrared light beam to form a first reflected light beam. The secondary reflecting mirror is located on the reflection light path of the primary reflecting mirror, and is used to reflect the first reflected light beam to form a second reflected light beam. The second reflected light beam reaches an image surface after passing through the incident infrared light beam. The reflective surfaces of the primary reflecting mirror and the secondary reflecting mirror are freeform surfaces. The secondary reflecting mirror and the image plane are respectively located on both sides of the incident infrared light beam.
    Type: Application
    Filed: June 2, 2021
    Publication date: February 17, 2022
    Inventors: WEI-CHEN WU, JUN ZHU, GUO-FAN JIN, SHOU-SHAN FAN
  • Publication number: 20210360820
    Abstract: A fan control circuit for controlling at least one fan of a power supply device includes a load sensing unit, a temperature sensing unit, a control unit connected to the load sensing unit, the temperature sensing unit and the fan, and a mode switching unit. The load sensing unit generates a load signal according to an output condition of the power supply device. The temperature sensing unit senses the temperature in the power supply device and generates a temperature signal. The control unit comprises a low-speed operating mode for controlling the fan according to the load signal, a mute mode for controlling the fan according to the temperature signal, and a full-speed operating mode for controlling the fan to run in a rated rotational speed. The mode switching unit controls the control unit to adjust the rotational speed of the fan by one of the three modes.
    Type: Application
    Filed: May 13, 2020
    Publication date: November 18, 2021
    Inventor: WEI-CHEN WU
  • Publication number: 20210215924
    Abstract: A freeform surface optical telescope imaging system is provided. The freeform surface optical telescope imaging system comprises a primary mirror, a secondary mirror, a compensating minor, and a spherical mirror. The primary minor, the secondary minor, the compensating minor, and the spherical mirror are spaced from each other. A surface shape of each of the primary mirror and the secondary mirror is a quadric surface. The primary mirror is used as an aperture stop. A surface shape of the compensating mirror is a freeform surface. A surface shape of the spherical mirror is a spherical surface. A light emitted from a light source would be reflected by the primary mirror, the secondary minor, the compensating mirror, and the spherical mirror to form an image on an image plane.
    Type: Application
    Filed: August 21, 2020
    Publication date: July 15, 2021
    Inventors: JUN ZHU, Rui-rui Tang, WEI-CHEN WU, GUO-FAN JIN, SHOU-SHAN FAN
  • Publication number: 20210215918
    Abstract: A freeform surface off-axial three-mirror imaging system is provided. The freeform surface off-axial three-mirror imaging system comprises a primary mirror, a secondary mirror, and a compensating mirror. The primary mirror, the secondary mirror, and the compensating mirror are located adjacent and spaced away from each other. A surface shape of each of the primary mirror and the secondary mirror is a quadric surface. The primary mirror is used as an aperture stop. A surface shape of the compensating mirror is a freeform surface. A light emitted from a light source is reflected by the primary mirror, the secondary mirror, and the compensating mirror to form an image on an image plane.
    Type: Application
    Filed: August 21, 2020
    Publication date: July 15, 2021
    Inventors: JUN ZHU, Rui-rui Tang, WEI-CHEN WU, GUO-FAN JIN, SHOU-SHAN FAN
  • Patent number: 11025841
    Abstract: The present invention relates to a method for designing a freeform surface reflective imaging system, comprising: selecting an initial system, wherein an FOV of the initial system is X0×Y0; selecting an FOV sequence as [X0, Y0], [X1, Y1], [X2, Y2], . . . , [Xn, Yn], while the FOV of the system to be designed is Xn×Yn, and X0<X1<X2< . . . <Xn, Y0<Y1<Y2< . . . <Yn; using point-by-point methods to construct all freeform surfaces of the initial system in the FOV of X1×Y1; setting the system obtained in the last step as a second initial system for system construction in the FOV of X2×Y2; repeating the last step to execute system construction in the order of the FOV sequence until the final FOV Xn×Yn is obtained.
    Type: Grant
    Filed: June 24, 2020
    Date of Patent: June 1, 2021
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Wei-Chen Wu, Jun Zhu, Guo-Fan Jin, Shou-Shan Fan
  • Publication number: 20210118125
    Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.
    Type: Application
    Filed: December 15, 2020
    Publication date: April 22, 2021
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung, Kuang-Shing Chen, Li-Jou Lee, Yung-Cheng Lin, Wei-Chen Wu, Shih-Chang Wang, Chien-An Lin