Abstract: A substrate used in a semiconductor device. The substrate includes a first wiring layer, a second wiring layer, and an interconnection-wiring layer. The first wiring layer includes a plurality of first pads while the second wiring layer includes a plurality of second pads. The interconnection-wiring layer is set between the first and second wiring layer. In this case, at least one of the second pads isn't electrically connected with anyone of the first pads, and other second pads that located adjacent to this second pad, which is not electrically connected with the first pads, electrically connect to the interconnection-wiring layer. Furthermore, this invention also discloses a semiconductor device including the substrate.

Abstract: A flip chip package structure. The structure includes a substrate, an IC chip electrically connected to the substrate through a plurality of conductive bumps, encapsulant between the substrate and IC chip, and an electrically protective device. The substrate has interior wiring, a plurality of first contacts arranged at a predetermined pitch among each other on a surface, and a trace line area beyond the first contacts on the surface. The electrically protective device has a protruding part covering the IC chip, and an extending part extending over the surface of the substrate with a gap as large as 40 mil. The extending part further covers the trace line area, and connects to the surface of the substrate using a fixing material.

Abstract: An integrated circuit package capable of improving signal quality is disclosed. The integrated circuit package comprises a first substrate, an integrated circuit chip attached on the first surface of the first substrate. This integrated circuit package further comprises a plurality of external terminals mounted on the first substrate and a plurality of first bonding pads mounted on the edge portion of the first surface of the first substrate and respectively connected to the corresponding external terminals. Also, the integrated circuit package further comprises a second substrate and a plurality of second bonding pads mounted on the second surface of the second substrate and connected to the first bonding pads formed on the first substrate. Furthermore, this integrated circuit package further comprises a plurality of passive components disposed on the second substrate.

Abstract: A process for fabricating a flip-chip substrate with metal bumps thereon. A flip-chip substrate is provided with conductive points thereon and a conductive film is formed over the surface of the flip-chip substrate to cover the conductive points. A photoresist layer is formed over the conductive layer and then patterned to form openings exposing the underlying conductive points. A copper plating is performed to fill the openings as copper bumps. The photoresist layer and the conductive film are removed. Finally, a solder mask layer is formed over the flip-chip substrate and exposing the copper bumps and an anti-oxidation treatment is performed to finish exposing the copper bumps.

Abstract: A flip chip assembly process forming an underfill encapsulant. The method includes providing a chip having an active surface and a plurality of conductive bumps arranged in array with a predetermined bump pitch thereon, providing a substrate having a surface, having a die-attaching region, having a plurality of pads with previously formed solder paste thereon, arranged in array with a predetermined pad pitch the same as the active surface, forming an encapsulant in the die-attaching region excluding the pads, using a stencil and screen printing, and attaching the chip onto the substrate resulted from one-to-one joining the conductive bumps and the pads. A tool forming an underfill encapsulant is includes a stencil having at least one printing region, including a plurality of openings, a plurality of covers arranged in array with a predetermined cover pitch, and a plurality of connecting devices, connecting every two neighboring covers, or each cover with other regions of the stencil.

Abstract: A chip-packaging substrate and test method therefor. The chip-packaging substrate includes at least one package area and a connection area enclosed by and connected to the package areas. A test circuit is arranged within the connection area, passing through at least two wire layers and the insulation layer therebetween. The test circuit electrically connects the first electrodes. Failure of the chip-packaging substrate is detected when the test circuit is open between any two electrodes.

Abstract: A die paddle for receiving an integrated circuit die in a plastic substrate. The die paddle is defined by a copper film on the plastic substrate and comprises a plurality of via holes through the plastic substrate, a plurality of opening through the copper film, and a gold-containing ring formed on the peripheral portion of the copper film. The outermost openings (and/or the outermost via holes) and the gold-containing ring are separated by a distance of about 1 to about 20 mils.

Abstract: A partially embedded decoupling capacitor is provided as an integral part of a semiconductor chip for reducing delta-I noise. The semiconductor chip includes a plurality of embedded metal layers, a passivation layer formed above the plurality of embedded metal layers as a topmost layer of the semiconductor chip, and a plurality of bonding pads disposed on the passivation layer. A surface planar metal pattern is formed on the passivation layer and electrically connected to one of the plurality of embedded metal layers through one of the plurality of bonding pads or a via hole opened on the passivation layer. For example, the surface planar metal pattern may be connected to a power layer or a ground layer of the semiconductor chip. Therefore, the partially embedded decoupling capacitor is made up of the surface planar metal pattern as an electrode, others of the plurality of embedded metal layers as opposite electrodes, and the passivation layer sandwiched therebetween as a dielectric layer.

Abstract: A multi-layered substrate having built-in capacitors is disclosed. The substrate comprises at least one high permittivity of dielectric material filled in the through holes between the power plane and the ground plane so as to form capacitors. The built in capacitors are to decouple high frequency noise due to the voltage fluctuation.

Abstract: The invention provides a semiconductor package substrate, which includes a substrate, a chip contact area, an inner pad portion, an outer pad portion and a conductive layer. The chip contact area, the inner pad portion, the outer pad portion and the conductive layer are formed on one side of the substrate, wherein the outer pad portion encloses the inner pad portion that surrounds the chip contact area in the center of the substrate. The inner pad portion and the outer pad portion contain a plurality of signal pads and a plurality of shielding pads respectively, while the conducti0ve layer and each of the shielding pads are electrically connected.

Abstract: An integrated circuit package capable of improving signal quality is disclosed. The integrated circuit package comprises a first substrate, an integrated circuit chip attached on the first surface of the first substrate. This integrated circuit package further comprises a plurality of external terminals mounted on the first substrate and a plurality of first bonding pads mounted on the edge portion of the first surface of the first substrate and respectively connected to the corresponding external terminals. Also, the integrated circuit package further comprises a second substrate and a plurality of second bonding pads mounted on the second surface of the second substrate and connected to the first bonding pads formed on the first substrate. Furthermore, this integrated circuit package further comprises a plurality of passive components disposed on the second substrate.

Abstract: The present invention discloses a packaging device, which embeds a capacitor on a chip so as to effectively filter out the current noise. The packaging device of the invention includes a substrate, a chip, and at least one capacitor. The chip is configured on the substrate and includes at least one power line and ground line. The at least one capacitor is configured on the surface of the chip and electrically connected to the power line and ground line. Furthermore, the invention can configure at least one capacitor on a carrier board attached on the surface of the chip, and the at least one capacitor is electrically connected to the power line and ground line through circuits of the carrier board.

Abstract: An integrated circuit device. The substrate includes a signal connection point and two shielding connection points set at the two sides of the signal connection point. The chip is set on the substrate. There are a signal pad and two shielding pads set at the two sides of the signal pad on the edge of the chip. The signal wire bonding is coupled to the signal connection point and the signal pad. Two shielding wire bondings are coupled to the shielding connection points and the shielding pads and extend along both sides of the signal wire bonding. The signal trace line is set on the substrate and coupled to the signal connection point. The power ring circuit is set on the substrate and coupled to the shielding connection points. The power circuit includes two shielding lines extending along both sides of the signal trace line.

Abstract: A chip-packaging substrate. The substrate is capable of reducing damage during packaging, shrinking its connecting portions so that the length of any of the gap slots between the packaging portion and the frame portion of the substrate is increased. Furthermore, a dummy layer is provided to one surface of the frame portion to flush the surface on the frame portion with that of the packaging portion as much as possible.

Abstract: An integrated circuit device. The integrated circuit device comprises a chip having a plurality of ground pads and power pads, a substrate having a ground ring and a power ring, and a plurality of first and second bonding wires electrically connecting the ground and power pads to the ground and power ring, wherein the ground pads are arranged closely in a first group and the power pads are arranged closely in a second group, thereby separating the first and second bonding wires from each other.

Abstract: A bond pad structure and a method of fabricating such structure are disclosed in the invention. The bond pad structure is formed over a predetermined area defined on a semiconductor substrate. The bond pad structure includes at least two metal layers formed over the predetermined area and at least one sub-structure combination layer which each is formed over the predetermined area and formed between two corresponding first metal layers. Each sub-structure combination layer includes a dielectric layer formed over the predetermined area, formed-through via openings with special disposition on the dielectric layer, a first diffusion barrier layer formed over the dielectric layer and the sidewalls and bottom of the via openings, a metal material filled into the via openings to form via plugs, and a second diffusion barrier layer formed over the first diffusion barrier layer and via plugs.

Abstract: An apparatus for reducing an electrical noise inside a ball grid array package is disclosed. The apparatus mainly comprises a substrate, a plurality of solder balls and a plurality of inside-connected capacitors. The substrate includes a contact layer, a power plane and a ground plane. The plurality of solder balls are fixed on the contact layer. The plurality of inside-connected capacitors are fixed on the contact layer, and a conductive glue is used to electrically connect the capacitors to the power plane and ground plane to reduce the electrical noise between the power plane and ground plane.

Abstract: A testing jig for semiconductor components, mainly comprising a main jig body, wherein on its bottom is provided with a retrieving head. While on the center of the bottom of the retrieving head is provided with a concave space, around which is arranged a plurality of air holes which are connected with the internal airways and also connected with the air inlet on the top of the main body. Furthermore, on the bottom of the main jig body is provided with two buffer blocks on opposite sides, which can prevent the chip on the center of the base board from being contacted with external force or foreign objects in the process of retrieving the base board during testing.

Abstract: A multi-layer substrate for an IC chip having a plurality of pads comprises a first layer having a plurality of conducting lines electrically connected to the pads of the IC chip, whereby a first current is generated in the conducting lines, and a second layer has a ground plane electrically connected to a ground, and a plurality of via holes penetrating the second layer and the conducting plane, wherein the via holes are arranged to make a second current in the conducting plane induced by the first current flowing to the ground.

Abstract: The present invention relates to a testing jig for semiconductor components, mainly comprising a main jig body, wherein on its bottom is provided with a retrieving head. While on the center of the bottom of the retrieving head is provided with a concave space, around which is arranged a plurality of air holes which are connected with the internal airways and also connected with the air inlet on the top of the main body. Furthermore, on the bottom of the main jig body is provided with two buffer blocks on opposite sides, which can prevent the chip on the center of the base board from being contacted with external force or foreign objects in the process of retrieving the base board during testing.