Patents by Inventor Wei Hong WENG

Wei Hong WENG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11574090
    Abstract: In a device engineering method, data of a plant network hierarchy (PNH) and registered devices (RD) in a device management server are synchronized to a device simulation server (SS). In a simulation mode, at least one function of device management system is executed via communicating with simulated devices (SD), while the device management system being not communicatively coupled to any physical control station configured to control physical field devices in a real plant. Virtual parameters are introduced into the SD. For device configuration, simulation is made of configurable device parameters; non-configurable device parameters; and device status, with SD generated from DD files in the PNH for the RD in the FDCS. Parallel communications including sending communication requests from a CRH component to the SD in the PNH from the CRH component in the FDCS to the SD in the PNH are executed simultaneously.
    Type: Grant
    Filed: September 3, 2019
    Date of Patent: February 7, 2023
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventors: JingXiang Xu, Kim Fatt Ng, Wei Hong Weng
  • Patent number: 11150632
    Abstract: A plant device management system, which is configured to efficiently manage parameter information for field devices, in order for plant engineering, operation and maintenance is disclosed. The plant device management system includes, but is not limited to, a device parameter set manager, which is configured for creating class parameter set, configuring class parameter set, assigning class parameter set, auditing parameters and so forth. The device parameter set manager of the plant device management system may include, but is not limited to, a device parameter set creator tool, a device parameter set configuring tool, a device template manager and a device parameter auditor.
    Type: Grant
    Filed: March 16, 2018
    Date of Patent: October 19, 2021
    Assignee: Yokogawa Electric Corporation
    Inventors: Wei Hong Weng, Ma Norina Epa Jandusay, Charisma Delos Reyes Cu-Unjieng
  • Publication number: 20210064712
    Abstract: In a device engineering method, data of a plant network hierarchy (PNH) and registered devices (RD) in a device management server are synchronized to a device simulation server (SS). In a simulation mode, at least one function of device management system is executed via communicating with simulated devices (SD), while the device management system being not communicatively coupled to any physical control station configured to control physical field devices in a real plant. Virtual parameters are introduced into the SD. For device configuration, simulation is made of configurable device parameters; non-configurable device parameters; and device status, with SD generated from DD files in the PNH for the RD in the FDCS. Parallel communications including sending communication requests from a CRH component to the SD in the PNH from the CRH component in the FDCS to the SD in the PNH are executed simultaneously.
    Type: Application
    Filed: September 3, 2019
    Publication date: March 4, 2021
    Applicant: Yokogawa Electric Corporation
    Inventors: JingXiang XU, Kim Fatt NG, Wei Hong WENG
  • Publication number: 20190286098
    Abstract: A plant device management system, which is configured to efficiently manage parameter information for field devices, in order for plant engineering, operation and maintenance is disclosed. The plant device management system includes, but is not limited to, a device parameter set manager, which is configured for creating class parameter set, configuring class parameter set, assigning class parameter set, auditing parameters and so forth. The device parameter set manager of the plant device management system may include, but is not limited to, a device parameter set creator tool, a device parameter set configuring tool, a device template manager and a device parameter auditor.
    Type: Application
    Filed: March 16, 2018
    Publication date: September 19, 2019
    Applicant: Yokogawa Electric Corporation
    Inventors: Wei Hong Weng, Ma Norina Epa Jandusay, Charisma Delos Reyes Cu-Unjieng
  • Patent number: 9846609
    Abstract: The present invention provides methods, systems and computer program products for detecting a configuration error or operating error corresponding to an input/output (I/O) device. The I/O device comprises a plurality of I/O points configured to establish a combined I/O channel between said I/O device and a field device, said combined I/O channel comprising a primary I/O channel and at least one secondary I/O channel.
    Type: Grant
    Filed: December 11, 2015
    Date of Patent: December 19, 2017
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Jasper Bryan Sale Ratilla, Wei Hong Weng
  • Publication number: 20170168883
    Abstract: The present invention provides methods, systems and computer program products for detecting a configuration error or operating error corresponding to an input/output (I/O) device. The I/O device comprises a plurality of I/O points configured to establish a combined I/O channel between said I/O device and a field device, said combined I/O channel comprising a primary I/O channel and at least one secondary I/O channel.
    Type: Application
    Filed: December 11, 2015
    Publication date: June 15, 2017
    Applicant: Yokogawa Engineering Asia Pte. Ltd.
    Inventors: Jasper Bryan Sale Ratilla, Wei Hong Weng
  • Publication number: 20160132037
    Abstract: The invention comprises a configuration system for a process control system that is configured for performing process control. The configuration system comprises a repository including at least one memory and one or more definition modules stored in the memory. Each definition module may comprise control logic for controlling an associated component. The configuration system also comprises a repository controller. The repository controller may be configured to receive user input identifying one or more properties of a specific component within the industrial system. The repository controller may additionally enable selection of a definition module from within the repository, wherein the selected definition module comprises control logic for controlling an associated component having the identified one more component properties. The invention additionally provides a method for configuring a process control system for performing process control.
    Type: Application
    Filed: November 11, 2014
    Publication date: May 12, 2016
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Wei Hong WENG, Alexander YAP, Prakash MARIAPPAN
  • Patent number: 8930001
    Abstract: A method of model identification for a process with unknown initial conditions in an industrial plant, the method comprising collecting a set of manipulated variables and corresponding set of process variables from the process; obtaining a plurality of manipulated variables from the collected set of manipulated variables; for each of the plurality of manipulated variables, obtaining optimal model parameters of a model transfer function and computing a model fitting index for optimized simulated process variables generated by the model transfer function using the optimal model parameters; identifying a best model fitting index among the model fitting indices computed; selecting a manipulated variable associated with the best model fitting index as an initial steady state condition for the model transfer function; and selecting the optimal model parameters corresponding with the best model fitting index as the best model parameters of the model transfer function to tune the controller.
    Type: Grant
    Filed: September 19, 2011
    Date of Patent: January 6, 2015
    Assignee: Yokogawa Electric Corporation
    Inventors: Shengjing Mu, Stephen Wei Hong Weng, Joseph Ching Hua Lee
  • Publication number: 20130073061
    Abstract: A method of model identification for a process with unknown initial conditions in an industrial plant, the method comprising collecting a set of manipulated variables and corresponding set of process variables from the process; obtaining a plurality of manipulated variables from the collected set of manipulated variables; for each of the plurality of manipulated variables, obtaining optimal model parameters of a model transfer function and computing a model fitting index for optimized simulated process variables generated by the model transfer function using the optimal model parameters; identifying a best model fitting index among the model fitting indices computed; selecting a manipulated variable associated with the best model fitting index as an initial steady state condition for the model transfer function; and selecting the optimal model parameters corresponding with the best model fitting index as the best model parameters of the model transfer function to tune the controller.
    Type: Application
    Filed: September 19, 2011
    Publication date: March 21, 2013
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Shengjing Mu, Stephen Wei Hong Weng, Joseph Ching Hua Lee