Patents by Inventor Wei-Hsuan Tu

Wei-Hsuan Tu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070053278
    Abstract: A method for calculating a metric indicating a symmetry of a signal waveform includes inverting the signal waveform to produce an inverted signal waveform; measuring a first set of peak, bottom, and average values corresponding to the signal waveform by detecting a peak value of the signal waveform, detecting a bottom value of the signal waveform, and detecting an average value of the signal waveform; measuring a second set of peak, bottom, and average values of the inverted signal waveform by detecting a peak value of the inverted signal waveform, detecting a bottom value of the inverted signal waveform, and detecting an average value of the inverted signal waveform; and calculating the metric indicating the symmetry of the signal waveform according to the first set of peak, bottom, and average values of the signal waveform, and the second set of peak, bottom, and average values of the inverted signal waveform.
    Type: Application
    Filed: July 31, 2006
    Publication date: March 8, 2007
    Inventors: Wei-Hsuan Tu, Tse-Hsiang Hsu
  • Patent number: 7099788
    Abstract: The present invention discloses a multiphase waveform generator capable of performing phase calibration, and a related phase calibration method. The disclosed multiphase waveform generator includes a multiphase waveform generating module and a calibrating module. The multiphase waveform generating module receives an input signal and shifts edges of the input signal by a delay time according to a delay parameter to generate a phase-modified signal. The calibrating module is coupled to the multiphase waveform generating module for calibrating the delay time to reduce a difference between a characteristic value of the phase-modified signal and an expected value, which is calculated according to the delay parameter and characteristic values of a first and a second predetermined periodic signal.
    Type: Grant
    Filed: April 28, 2005
    Date of Patent: August 29, 2006
    Assignee: Mediatek Incorporation
    Inventors: Tse-Hsiang Hsu, Wei-Hsuan Tu
  • Publication number: 20050246141
    Abstract: The present invention discloses a multiphase waveform generator capable of performing phase calibration, and a related phase calibration method. The disclosed multiphase waveform generator includes a multiphase waveform generating module and a calibrating module. The multiphase waveform generating module receives an input signal and shifts edges of the input signal by a delay time according to a delay parameter to generate a phase-modified signal. The calibrating module is coupled to the multiphase waveform generating module for calibrating the delay time to reduce a difference between a characteristic value of the phase-modified signal and an expected value, which is calculated according to the delay parameter and characteristic values of a first and a second predetermined periodic signal.
    Type: Application
    Filed: April 28, 2005
    Publication date: November 3, 2005
    Inventors: Tse-Hsiang Hsu, Wei-Hsuan TU