Patents by Inventor Wei-I LIU

Wei-I LIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240153979
    Abstract: A method of manufacturing an image sensor structure includes forming an isolation structure in a substrate to divide the substrate into a first region and a second region, forming a first light sensing region in the first region and a second light sensing region in the second region, forming a first gate structure over the first light sensing region and a second gate structure over the second light sensing region, forming gate spacers on sidewalls of the first and second gate structures, and depositing a blocking layer on sidewalls of the gate spacers. The blocking layer has an opening positioned between the first and second gate structures. A source/drain structure is formed directly under the opening in the blocking layer. The method also includes forming an interlayer dielectric layer over the first and second gate structures and the blocking layer.
    Type: Application
    Filed: April 13, 2023
    Publication date: May 9, 2024
    Inventors: Wei Long CHEN, Wen-I HSU, Feng-Chi HUNG, Jen-Cheng LIU, Dun-Nian YAUNG
  • Publication number: 20240085803
    Abstract: Photolithography overlay errors are a source of patterning defects, which contribute to low wafer yield. An interconnect formation process that employs a patterning photolithography/etch process with self-aligned interconnects is disclosed herein. The interconnection formation process, among other things, improves a photolithography overlay (OVL) margin since alignment is accomplished on a wider pattern. In addition, the patterning photolithography/etch process supports multi-metal gap fill and low-k dielectric formation with voids.
    Type: Application
    Filed: November 20, 2023
    Publication date: March 14, 2024
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Tai-I Yang, Wei-Chen Chu, Hsiang-Wei Liu, Shau-Lin Shue, Li-Lin Su, Yung-Hsu Wu
  • Publication number: 20180144098
    Abstract: A drug combination prediction method comprising: storing a plurality of original gene sets, at least one first gene impacted by a first drug and at least one second gene impacted by a second drug; determining the part of the at least one first gene and the part of the at least one second gene to be a first interaction gene set; calculating a gene amount of the first interaction gene set to obtain a first interaction gene amount, and calculating a first percentage generated by the first interaction gene amount in the first original gene set; calculating an interaction value of the combination of the first drug and the second drug according to the first percentage; and selecting at least one synergistic pharmaceutical composition according to the interaction value.
    Type: Application
    Filed: December 1, 2016
    Publication date: May 24, 2018
    Inventors: Wei-I LIU, Yu-Shian CHIU, Joey Jen-Hui SYU, Chia-Shan HSIEH, Mong-Hsun TSAI, Tzu-Pin LU, Liang-Chuan LAI, Eric Y. CHUANG, Hui-I HSIAO
  • Publication number: 20170147744
    Abstract: A system for analyzing sequencing data of bacterial strains and a method thereof are provided. The method for analyzing sequencing data of bacterial strains includes the following steps: searching a specific variable region of a first genetic sample sequence and searching another specific variable region of a second genetic sample sequence; determining whether both the specific variable region and the another specific variable region have an identical cross-sample subsequence; if both the specific variable region and the another specific variable region have the identical cross-sample subsequence, storing the cross-sample subsequence into a recording table; and if the identical cross-sample subsequence exists, comparing the cross-sample subsequence with a plurality of gene sequences of known strains stored in a database module to analyze a plurality of strains corresponding to the cross-sample subsequence in the first genetic sample sequence and the second genetic sample sequence.
    Type: Application
    Filed: December 8, 2015
    Publication date: May 25, 2017
    Inventors: Chia-Yang CHENG, Joey Jen-Hui, SYU, Wei-I LIU, Mong-Hsun TSAI, Tzu-Pin LU, Liang-Chuan LAI, Eric-Y CHUANG