Patents by Inventor Wei-Shi Liang

Wei-Shi Liang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240136317
    Abstract: According to an exemplary embodiment, a substrate having a first area and a second area is provided. The substrate includes a plurality of pads. Each of the pads has a pad size. The pad size in the first area is larger than the pad size in the second area.
    Type: Application
    Filed: January 3, 2024
    Publication date: April 25, 2024
    Inventors: Wei-Hung Lin, Hsiu-Jen Lin, Ming-Da Cheng, Yu-Min Liang, Chen-Shien Chen, Chung-Shi Liu
  • Patent number: 5953448
    Abstract: Systems, methods, and apparatus for enabling the use of phase measurement profilometry techniques for measuring the surface contour of an object having a surface discontinuity thereon are disclosed. A method for correcting optical phase orders in a computer-generated image includes selecting a local region and linking identified key data points and block points with a blocking line. An intensity value of zero is assigned to each pixel located on the blocking line from which the correct optical phase order for each pixel in the local region can then be determined. Multiple block point identification methods are provided, the particular combination of which is highly efficient in locating block points in an area adjacent a surface discontinuity.
    Type: Grant
    Filed: March 1, 1996
    Date of Patent: September 14, 1999
    Assignee: Textile/Clothing Technology Corporation
    Inventor: Wei-Shi Liang