Patents by Inventor Wei Wei Wei

Wei Wei Wei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7785165
    Abstract: A method for manufacturing a field emission electron source includes the following steps: (a) providing a pair of conductive bases (32, 42) each having a top (322, 422), the tops being spaced apart from and opposite to each other, the tops being immersed in a solution (50) having carbon nanotubes dispersed therein; (b) applying an alternating voltage (60) between the two conductive bases thereby causing at least one carbon nanotube to become assembled between the tops of the conductive bases; (c) shutting off the alternating voltage between the conductive bases and removing the solution between the tops of the two conductive bases; (d) detaching one of the two conductive bases in a matter such that the carbon nanotube remains connected with one of the tops of the conductive bases; and (e) modifying the carbon nanotube to create a low work function coating on a least a tip/free end thereof.
    Type: Grant
    Filed: September 1, 2006
    Date of Patent: August 31, 2010
    Assignees: Tsinghua University, Hon Hai Precision Industry Co., Ltd.
    Inventors: Wei Wei Wei, Kai-Li Jiang, Shou-Shan Fan
  • Patent number: 7508216
    Abstract: A method for measuring work function includes the steps of: (a) providing a field emission electron source having a carbon nanotube tip as a cathode electrode and a spaced anode electrode, having a predetermined spaced distance therebetween; (b) applying a voltage between the cathode electrode and the anode electrode and measuring a first current-voltage curve of the field emission electron source in a vacuum environment; (c) forming a layer of field emission material at least on the surface of the carbon nanotube tip; (d) measuring a second current-voltage curve of the now-treated field emission electron source in the same conditions as that in the step (b); (e) achieving two Fowler-Nordheim curves calculated from the two current-voltage curves according to the Fowler-Nordheim equation; and (f) comparing the two Fowler-Nordheim curves and calculating the work function of the field emission material therefrom.
    Type: Grant
    Filed: December 14, 2006
    Date of Patent: March 24, 2009
    Assignees: Tsinghua University, Hon Hai Precision Industry Co., Ltd.
    Inventors: Wei Wei Wei, Kai-Li Jiang Jiang, Shou-Shan Fan Fan