Patents by Inventor Wei-Xi Lu

Wei-Xi Lu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080170599
    Abstract: A calibration method for infrared temperature measuring instruments is disclosed. The calibration method of the present invention comprises the following five steps: (1) Calibrating the heat-flux resistor of an infrared temperature measuring instrument so as to obtain its calibrated resistance value (2) Using a digital multimeter to measure the parameters of the components and relevant circuits of the infrared temperature measuring instrument (3) Placing the infrared temperature measuring instrument in a blackbody radiation furnace so as to measure a single-point parameter of the blackbody radiation amplifier because the blackbody radiation furnace can provide a standard blackbody radiation source (4) Using the linear equation to obtain two additional parameters at two other temperatures so as to obtain a linear curve of the blackbody radiation amplifier (5) Storing the calibrated parameters in the memory of the infrared temperature measuring instrument.
    Type: Application
    Filed: January 15, 2007
    Publication date: July 17, 2008
    Applicant: SHANG MEI PRECISION INDUSTRIAL CO., LTD.
    Inventors: Wei-Ju Lien, Ting-Feng Wu, Wei-Xi Lu