Abstract: A touch module includes a base plate, a first magnet, a second magnet, a touch pad, a first magnetic board and a second magnetic board. The first magnet and the second magnet are installed on the base plate and separated from each other. The touch pad is located over the base plate to cover the first magnet and the second magnet. The first magnetic board and the second magnetic board are separated from each other, located under the touch pad and coupled with the touch pad. The first magnetic board is aligned with the first magnet. The second magnetic board is aligned with the second magnet. The driving circuit is electrically coupled with the first magnetic board and the second magnetic board. The first magnetic board induces a magnetic field of the first magnet. The second magnetic board induces a magnetic field of the second magnet.

Abstract: A method is provided for testing and for preventing over-erasure of unused redundant memory cells that can be subsequently used to replace defective memory cells in a Flash memory. An unused redundant memory cell is preprogrammed and tested simultaneously with each group of n memory cells. The selected unused redundant memory cell is preprogrammed only a couple of times and then skipped for the rest of the preprogramming pulses applied to the regular core cells. Each unused redundant memory cells is selected g times, where g is the ratio between the number of regular core cells and the number of redundant core cells in a row. As soon as an unused redundant memory cell is successfully preprogrammed, further preprogramming of that unused redundant memory cell is stopped until all regular cells in the group are preprogrammed. An unused redundant memory cell remains available as a replacement cell until chip testing is completed.

Abstract: A method is provided for testing and for preventing over-erasure of unused redundant memory cells that can be subsequently used to replace defective memory cells in a Flash memory. An unused redundant memory cell is preprogrammed and tested simultaneously with each group of n memory cells. The selected unused redundant memory cell is preprogrammed only a couple of times and then skipped for the rest of the preprogramming pulses applied to the regular core cells. Each unused redundant memory cells is selected g times, where g is the ratio between the number of regular core cells and the number of redundant core cells in a row. As soon as an unused redundant memory cell is successfully preprogrammed, further preprogramming of that unused redundant memory cell is stopped until all regular cells in the group are preprogrammed. An unused redundant memory cell remains available as a replacement cell until chip testing is completed.