Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.

Abstract: An electronic device includes a clock generating circuit, a receiving circuit and a training circuit. The clock generating circuit generates a sampling clock signal, a phase-early sampling clock signal and a phase-late sampling clock signal. The receiving circuit samples received data according to the sampling clock signal, the phase-early sampling clock signal and the phase-late sampling clock signal to generate a sample result. The training circuit controls the clock generating circuit to generate the sampling clock signal and the corresponding phase-early sampling clock signal and phase-late sampling clock signal that have different phases in a plurality of different time intervals, respectively, to cause the receiving circuit to generate a plurality of sample results. The training circuit further determines a sampling phase of the sampling clock signal according to the sample results.

Abstract: An electronic device includes a clock generating circuit, a receiving circuit and a training circuit. The clock generating circuit generates a sampling clock signal, a phase-early sampling clock signal and a phase-late sampling clock signal. The receiving circuit samples received data according to the sampling clock signal, the phase-early sampling clock signal and the phase-late sampling clock signal to generate a sample result. The training circuit controls the clock generating circuit to generate the sampling clock signal and the corresponding phase-early sampling clock signal and phase-late sampling clock signal that have different phases in a plurality of different time intervals, respectively, to cause the receiving circuit to generate a plurality of sample results. The training circuit further determines a sampling phase of the sampling clock signal according to the sample results.