Patents by Inventor Wei-Chen Li

Wei-Chen Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12030102
    Abstract: A hemming path planning method and a hemming system are provided. The hemming path planning method includes the following steps. An initial contour data of a target is scanned to obtain. A first segment of the hemming path is planned according to the initial contour data. The first segment corresponds to a first bending angle. A second segment of the hemming path is planned according to the initial contour data and an expected springback amount related to the first bending angle. The second segment corresponds to a second bending angle. The first segment and the second segment are combined to obtain a continuous hemming path.
    Type: Grant
    Filed: December 26, 2021
    Date of Patent: July 9, 2024
    Assignee: Industrial Technology Research Institute
    Inventors: Yi-Ping Huang, Ya-Hui Tsai, Wei-Chen Li, Bor-Tung Jiang, Chia-Hung Wu, Jen-Yuan Chang
  • Publication number: 20230166315
    Abstract: A hemming path planning method and a hemming system are provided. The hemming path planning method includes the following steps. An initial contour data of a target is scanned to obtain. A first segment of the hemming path is planned according to the initial contour data. The first segment corresponds to a first bending angle. A second segment of the hemming path is planned according to the initial contour data and an expected springback amount related to the first bending angle. The second segment corresponds to a second bending angle. The first segment and the second segment are combined to obtain a continuous hemming path.
    Type: Application
    Filed: December 26, 2021
    Publication date: June 1, 2023
    Applicant: Industrial Technology Research Institute
    Inventors: Yi-Ping Huang, Ya-Hui Tsai, Wei-Chen Li, Bor-Tung Jiang, Chia-Hung Wu, Jen-Yuan Chang
  • Publication number: 20140048994
    Abstract: A non-contact substrate chuck applies to sucking a substrate and comprises a first plate-like element, a second plate-like element paralleled the first plate-like element and a sucking element, wherein through holes of the first plate-like element and the second plate-like element jointly form a channel where the sucking element is accommodated. The chuck lets gas flow through a gas inlet of the sucking element toward the substrate to form a gap between an active surface of the substrate and a first surface of the first plate-like element. At least one side of the substrate is positioned by positioning protrusions of the first plate-like element. A least possible number of supporting points are used and arranged around the sides of the substrate without touching the substrate surface to prevent the substrate surface from being damaged. The present invention also discloses a vertical-type substrate supporting apparatus using the abovementioned chuck.
    Type: Application
    Filed: April 8, 2013
    Publication date: February 20, 2014
    Applicant: SCIENTECH CORP.
    Inventors: Wen-Ping TSAI, Wei-Chen LI
  • Patent number: 7903865
    Abstract: An automatic optical inspection system includes a rotary device for driving an object to rotate. At least one line-scan camera is implemented for generating two-dimensional planar images of cylindrical surfaces of the object. A device for detecting defects is operable to generate the two-dimensional planar images of the cylindrical surfaces of the object according to a normalized grayscale absolute difference inspection method.
    Type: Grant
    Filed: March 27, 2007
    Date of Patent: March 8, 2011
    Assignee: Chuang Hwa University
    Inventors: Wei-Chen Li, Yih-Chih Chiou
  • Publication number: 20080240541
    Abstract: An automatic optical inspection system includes a rotary device for driving an object to rotate. At least one line-scan camera is implemented for generating two-dimensional planar images of cylindrical surfaces of the object. A device for detecting defects is operable to generate the two-dimensional planar images of the cylindrical surfaces of the object according to a normalized grayscale absolute difference inspection method.
    Type: Application
    Filed: March 27, 2007
    Publication date: October 2, 2008
    Inventors: Yih-Chih Chiou, Wei-Chen Li