Abstract: A thin film magnetic recording medium with enhanced signal-to-noise ratio (SNR) comprises a non-magnetic substrate having a surface; and a layer stack atop the substrate surface, comprising at least one magnetic recording layer and a plurality of layers beneath the at least one magnetic recording layer, including: a first underlayer proximal the substrate surface; a second, grain size refinement underlayer in overlying contact with the first underlayer; a third, in-plane growth orientation underlayer in overlying contact with the second underlayer; and a magnetic stabilization layer in overlying contact with the third underlayer, wherein the third underlayer comprises manganese (Mn).

Abstract: A method of forming a dual-layer protective overcoat system on a surface of a workpiece, the protective overcoat system being abrasion and corrosion resistant and bondable to a lubricant topcoat, comprising sequential steps of:

Abstract: A flash chromium capping layer is deposited on a magnetic layer for improved corrosion resistance, reduced poisoning due to the absence of a protective overcoat or presence of discontinuities in a protective overcoat, and for reduced media noise do to inter-granular exchange coupling. Embodiments include depositing a flash chromium layer having a thickness up to about 10 Å on an upper magnetic layer and depositing an overlying lubricant topcoat. An optional protective overcoat, such as a carbon-containing protective overcoat, can also be deposited on the chromium capping layer. The chromium capping layer forms a protective oxide coating where exposed, as due to the absence of or at discontinuities in the protective overcoat.

Abstract: A method and an apparatus for optically determining a physical parameter such as thickness t, index of refraction n, extinction coefficient k or a related physical parameter such as energy bandgap Eg of a thin film. A test beam having a wavelength range &Dgr;&lgr; is used to illuminate the thin film after it is deposited on a complex substrate which has at least two layers and exhibits a non-monotonic and an appreciably variable substrate optical response over wavelength range &Dgr;&lgr;. Alternatively, the thin film can be deposited between the at least two layers of the complex substrate. A measurement of a total optical response, consisting of the substrate optical response and an optical response difference due to the thin film is performed over wavelength range &Dgr;&lgr;. The at least two layers making up the complex substrate are chosen such that the effect of multiple internal reflections in the complex substrate and the film is maximized.

Abstract: A method and apparatus for optically determining a physical parameter of an underlayer such as the underlayer refractive index N.sub.u, extinction coefficient k.sub.u and/or thickness t.sub.u through a top layer having a first top layer thickness t.sub.1 and an assigned refractive index index n.sub.t and coefficient of extinction k.sub.t. The values of index n.sub.t and extinction coefficient k.sub.t can be estimated, optically determined or assigned based on prior knowledge. In a subsequent step a first reflectance R.sub.1 is measured over a wavelength range .DELTA..lambda. by using a test beam spanning that wavelength range. Then, a second reflectance R.sub.2 of the top layer and underlayer is measured using the test beam spanning wavelength range .DELTA..lambda. at a second top layer thickness t.sub.2. In a calculation step the physical parameter of the underlayer is determined from the first reflectance measurement R.sub.1, the second reflectance measurement R.sub.