Abstract: A testing apparatus is provided for round discs, for example coins, in which the discs move along a supporting guide past at least one gauge. The round discs are fed onto an inclined chute surface from which they slide down and onto a collecting track, of which there is at least one, that is inclined with respect to the horizontal and that collects the discs and guides them away along a supporting guide. Thereafter, the discs are sent to an optoelectronic device for measurement of their diameters and/or thicknesses. This apparatus makes possible throughputs that are significantly higher than those of the previously known testing apparatuses.