Abstract: The present disclosure may relate to systems and methods for camera synchronization. A method may include determining a frequency difference between a first frequency of a first camera and a second frequency of a second camera. The method may also include synchronizing the second frequency of the second camera to the first frequency of the first camera based on the frequency difference. The method may further include directing the first camera and the second camera to execute camera operations under synchronized frequency.

Abstract: A rare earth element containing zeolitic material having an AEI-type framework structure, the framework structure of the zeolitic material comprising SiO2 and X2O3, X being a trivalent element, wherein the zeolitic material contains one or more rare earth elements as counter-ions at the ion exchange sites of the framework structure, and wherein the zeolitic material is obtainable and/or obtained according to a process involving the hydrothermal treatment of the rare earth element containing zeolitic material at a temperature in the range of from 400 to 1,000° C. A coated monolith substrate comprising a rare earth element containing zeolitic material having an AEI-type framework structure, wherein the zeolitic material is supported on the monolith substrate. A process for the production of a coated monolith substrate comprising a rare earth element containing zeolitic material having an AEI-type framework structure.

Abstract: A method to simulate operations of a manufacture plant comprising a plurality of machines, the method including receiving a capacity function and an elapsed time function associated with a first machine of the plurality of machines, wherein the capacity function and elapsed time function is defined by one or more parameters characterizing the first machine, receiving a record of historical production data associated with the first machine, calculating, based on the capacity function and the record of historical production data, an augmented capacity function and an augmented elapsed time function that is defined by the one or more parameters and a quantity relating to parts waiting for processing (WIP), and simulating the operations of the plant based on the augmented capacity function and augmented elapsed time function.

Abstract: A system and method include dividing, by a processor of a manufacturing execution system (MES), a time axis associated with a time window into a plurality of time slots, assigning an integer value to an integer variable indexed by a slot identifier, a machine identifier, and a wafer lot identifier, specifying one or more constraints based on the integer variable, wherein the one or more constraints comprise a wafer quantity constraint and a Q-time constraint, executing an optimization solver under the one or more constraints to determine a time and a quantity of wafer lots to be provided to each machine associated with the time window, and issuing a request to a controller to cause provision of the quantity of wafer lots to each machine associated with each step in the time window.

Abstract: A system and method include receiving, by a processing device of a manufacturing execution system (MES), a target profile associated with products, wherein the target profile comprises an identifier of a block of steps in a process to make the products and a target work-in-progress (WIP) value representing a target number of parts waiting to be processed by a group of machines used in the block of steps to make the products, identifying a move list or an assignment list that, when issued, causes the group of machines to operate to maintain a number of parts waiting for processing to match the target WIP value of the target profile.

Abstract: A method and system relate to executing, by a processing device, a first simulation of operations of a semiconductor manufacture plant without imposing a Q-time constraint on a Q-zone, determining a kanban capacity value associated with the Q-zone based on results from the first simulation, executing a second simulation of operations of the semiconductor manufacture plant using the kanban capacity value under the Q-time constraint, determining whether results of the second simulation meet performance indices, and responsive to determining that the results of the second plant simulation meet the performance indices, providing the kanban capacity value to a manufacture execution system to operate the semiconductor manufacture plant using the kanban capacity value.

Abstract: A dispatcher system associated with a manufacture execution system (MES) of a plant, where the MES uses a production database storing a table containing state information of a plurality machines in the plant to manage operation of the plurality of machines, the dispatcher system including a cache device to store a random accessible data sheet mapped to the table; and a processing device to provide a user interface to receive a dispatch application constructed based on a plurality of dispatch rules, the dispatch application comprising a database command directed to access the state information stored in the production database, convert the database command into a key-based search instruction in a target programming language, execute the key-based search instruction using a key to access the random accessible data sheet to generate a production plan, and issue the production plan to the MES to manage the operation of the plurality of machines.

Abstract: A system and method relating to determining, by a processing device, a first number of parts waiting to be processed in a subsequent step by a plurality of machines housed in a plurality of buildings interconnected by rails, determining a second number of parts that the plurality of machines housed in the plurality of buildings is capable of processing in the subsequent step of the manufacture process over a determined period of time, calculating a capability occupancy ratio based on the first number and the second number for each one of the plurality of buildings, determining a target building of the plurality of buildings based on the capability occupancy ratio, and causing to dispatch the part to the target building via the rails.

Abstract: A method and system relate to executing, by a processing device, a first simulation of operations of a semiconductor manufacture plant without imposing a Q-time constraint on a Q-zone, determining a kanban capacity value associated with the Q-zone based on results from the first simulation, executing a second simulation of operations of the semiconductor manufacture plant using the kanban capacity value under the Q-time constraint, determining whether results of the second simulation meet performance indices, and responsive to determining that the results of the second plant simulation meet the performance indices, providing the kanban capacity value to a manufacture execution system to operate the semiconductor manufacture plant using the kanban capacity value.

Abstract: A system and method relating to determining, by a processing device, a first number of parts waiting to be processed in a subsequent step by a plurality of machines housed in a plurality of buildings interconnected by rails, determining a second number of parts that the plurality of machines housed in the plurality of buildings is capable of processing in the subsequent step of the manufacture process over a determined period of time, calculating a capability occupancy ratio based on the first number and the second number for each one of the plurality of buildings, determining a target building of the plurality of buildings based on the capability occupancy ratio, and causing to dispatch the part to the target building via the rails.

Abstract: A system and method include receiving, by a processing device of a manufacturing execution system (MES), a target profile associated with products, wherein the target profile comprises an identifier of a block of steps in a process to make the products and a target work-in-progress (WIP) value representing a target number of parts waiting to be processed by a group of machines used in the block of steps to make the products, identifying a move list or an assignment list that, when issued, causes the group of machines to operate to maintain a number of parts waiting for processing to match the target WIP value of the target profile.

Abstract: A method to simulate operations of a manufacture plant comprising a plurality of machines, the method including receiving a capacity function and an elapsed time function associated with a first machine of the plurality of machines, wherein the capacity function and elapsed time function is defined by one or more parameters characterizing the first machine, receiving a record of historical production data associated with the first machine, calculating, based on the capacity function and the record of historical production data, an augmented capacity function and an augmented elapsed time function that is defined by the one or more parameters and a quantity relating to parts waiting for processing (WIP), and simulating the operations of the plant based on the augmented capacity function and augmented elapsed time function.

Abstract: A dispatcher system associated with a manufacture execution system (MES) of a plant, where the MES uses a production database storing a table containing state information of a plurality machines in the plant to manage operation of the plurality of machines, the dispatcher system including a cache device to store a random accessible data sheet mapped to the table; and a processing device to provide a user interface to receive a dispatch application constructed based on a plurality of dispatch rules, the dispatch application comprising a database command directed to access the state information stored in the production database, convert the database command into a key-based search instruction in a target programming language, execute the key-based search instruction using a key to access the random accessible data sheet to generate a production plan, and issue the production plan to the MES to manage the operation of the plurality of machines.

Abstract: Aspects of the invention relate to techniques for generating encrypted profiles for layout features. According to various implementations of the invention, a layout feature is partitioned into subdomains. The subdomains are associated with boundary nodes and internal nodes. Based on layout design and process profile data for the layout feature, a first electric parameter relationship is determined for the boundary nodes and the internal nodes. An encrypted profile for the layout feature is then generated by converting the first electric parameter relationship into a second electric parameter relationship involving the boundary nodes. The encrypted profile may be used for extracting parasitic parameters associated with the layout feature.