Patents by Inventor Welborn R Malpass

Welborn R Malpass has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for combined framing and packet delineation
    Patent number: 7327732
    Abstract: Incoming bit stream is processed by a single state machine into a circular buffer. Circular buffer accumulates subunits of data to form a major data unit. State machine recognizes the start of major data unit and flags the location of the major data unit in the circular buffer.
    Type: Grant
    Filed: November 27, 2002
    Date of Patent: February 5, 2008
    Assignee: Mindspeed Technologies, Inc.
    Inventors: Mark J Erlenborn, Jeff R. Gemar, George Harper, Kewei Yang, Welborn R Malpass, Sam L Spencer, Keith A Kind
  • Method and apparatus for optical probing of integrated circuit operation
    Patent number: 7049632
    Abstract: Optical transducers disposed on an integrated circuit correspond to test points thereon. The state of optical transducers perceived by an optical sensor is correlated to test points. Alignment of the optical sensor relative to the optical transducers is accomplished electronically or mechanically.
    Type: Grant
    Filed: December 24, 2002
    Date of Patent: May 23, 2006
    Assignee: Mindspeed Technologies, Inc.
    Inventors: Jeff R. Gemar, Mark J. Erlenborn, George Harper, Keith A. Kind, Welborn R. Malpass, Sam L. Spencer, Kewei Yang
  • Method and apparatus for telemetered probing of integrated circuit operation
    Patent number: 6865503
    Abstract: State of test points on an integrated circuit are encapsulated in a telemetry frame that is wirelessly conveyed to a test system. Test points may be logic levels or analog levels converted into representative multi-bit values. Conveyance off the circuit may be by radio frequency or optical emission.
    Type: Grant
    Filed: December 24, 2002
    Date of Patent: March 8, 2005
    Assignee: Conexant Systems, Inc.
    Inventors: George Harper, Mark L. Erlenborn, Keith A Kind, Welborn R Malpass, Sam L. Spencer, Kewei Yang, Jeff R. Gemar
  • Method and apparatus for optical probing of integrated circuit operation
    Publication number: 20040119069
    Abstract: Optical transducers disposed on an integrated circuit correspond to test points thereon. The state of optical transducers perceived by an optical sensor is correlated to test points. Alignment of the optical sensor relative to the optical transducers is accomplished electronically or mechanically.
    Type: Application
    Filed: December 24, 2002
    Publication date: June 24, 2004
    Inventors: Jeff R. Gemar, Mark J. Erlenborn, George Harper, Keith A. Kind, Welborn R. Malpass, Sam L. Spencer, Kewei Yang
  • Method and apparatus for telemetered probing of integrated circuit operation
    Publication number: 20040113809
    Abstract: State of test points on an integrated circuit are encapsulated in a telemetry frame that is wirelessly conveyed to a test system. Test points may be logic levels or analog levels converted into representative multi-bit values. Conveyance off the circuit may be by radio frequency or optical emission.
    Type: Application
    Filed: December 24, 2002
    Publication date: June 17, 2004
    Inventors: George Harper, Mark L. Erlenborn, Keith A. Kind, Welborn R. Malpass, Sam L. Spencer, Kewei Yang, Jeff R. Gemar