Abstract: The disclosure provides an electronic device including an electronic assembly, a heat dissipating component, an electromagnetic shielding structure and an electromagnetic shielding shed. The electronic assembly includes a circuit board, a processor, a memory and a bus. The processor, the memory and the bus are stacked on the circuit board. The bus is located between and electrically connected to the processor and the memory. The heat dissipating component is staked on the processor. The electromagnetic shielding structure covers the memory. A side of the electromagnetic shielding shed is connected to the electromagnetic shielding structure, another side of the electromagnetic shielding shed is connected to the heat dissipating component, and the electromagnetic shielding shed covers at least part of the bus.

Abstract: An electrostatic field interference testing apparatus and a method using the same are disclosed. The electrostatic field interference testing apparatus includes an electrostatic discharge generator and a conducting element placed in the neighborhood of an output end of the electrostatic discharge generator where an electrostatic discharge takes place and electrically coupled to a ground end. When the electrostatic discharge generator performs an air discharge on the conducting element, a testing electromagnetic field may be generated as the result of a transient current spike. The testing electromagnetic field is thereafter utilized to determine whether the protection of a DUT against electric/magnetic field strength is suitable.