Abstract: An electronic package having multiple pins may be tested in parallel for output short circuit current by simulating a direct short to ground by simultaneously connecting multiple output pins directly to ground in order to active a current limiter associated with each of the output pins. The pins are then connected to a resistive connection to ground via a set of resistors; the direct ground is then removed, such that the current limiter associated with each of the output pins remains activated. A voltage drop across each of the set of resistors is measured simultaneously. An output short circuit current fault is indicated when the voltage drop across any of the resistors exceeds a threshold value corresponding to a maximum output short circuit current value.

Abstract: An electronic package having multiple pins may be tested in parallel for output short circuit current by simulating a direct short to ground by simultaneously connecting multiple output pins directly to ground in order to active a current limiter associated with each of the output pins. The pins are then connected to a resistive connection to ground via a set of resistors; the direct ground is then removed, such that the current limiter associated with each of the output pins remains activated. A voltage drop across each of the set of resistors is measured simultaneously.