Patents by Inventor Wen-Jen LO

Wen-Jen LO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Composite product testing system and testing method
    Patent number: 10677841
    Abstract: A composite product testing system including a main management system, a test equipment and a burn-in apparatus is disclosed. The test equipment and the burn-in apparatus are both arranged in a burn-in chamber of the testing system. First, multiple tested products are respectively inserted in multiple gauges of the burn-in chamber, and a burn-in procedure is activated for providing an aging environment. The main management system controls one of the gauges to connect with the test equipment for the test equipment to perform testing on the tested product upon the connected gauge. After the testing is completed, the main management system then controls the gauge to disconnect from the test equipment and re-connect with the burn-in apparatus, so as to monitor the tested product upon the gauge during the burn-in procedure.
    Type: Grant
    Filed: January 3, 2018
    Date of Patent: June 9, 2020
    Assignee: DELTA ELECTRONICS, INC.
    Inventors: Chien-Chung Chang, Hung-Pin Yu, Yu-Jen Chen, Wen-Jen Lo, Chih-Yen Liu
  • COMPOSITE PRODUCT TESTING SYSTEM AND TESTING METHOD
    Publication number: 20180252764
    Abstract: A composite product testing system including a main management system, a test equipment and a burn-in apparatus is disclosed. The test equipment and the burn-in apparatus are both arranged in a burn-in chamber of the testing system. First, multiple tested products are respectively inserted in multiple gauges of the burn-in chamber, and a burn-in procedure is activated for providing an aging environment. The main management system controls one of the gauges to connect with the test equipment for the test equipment to perform testing on the tested product upon the connected gauge. After the testing is completed, the main management system then controls the gauge to disconnect from the test equipment and re-connect with the burn-in apparatus, so as to monitor the tested product upon the gauge during the burn-in procedure.
    Type: Application
    Filed: January 3, 2018
    Publication date: September 6, 2018
    Inventors: Chien-Chung CHANG, Hung-Pin YU, Yu-Jen CHEN, Wen-Jen LO, Chih-Yen LIU