Abstract: An electronic device may have a display with touch sensors. One or more shielding layers may be interposed between the display and the touch sensors. The display may include transistors with gate conductors, a first planarization layer formed over the gate conductors, one or more contacts formed in a first source-drain layer within the first planarization layer, a second planarization layer formed on the first planarization layer, one or more data lines formed in a second source-drain layer within the second planarization layer, a third planarization layer formed on the second planarization layer, and a data line shielding structure formed at least partly in a third source-drain layer within the third planarization layer. The data line shielding structure may be a routing line, a blanket layer, a mesh layer formed in one or more metal layers, and/or a data line covering another data line.

Abstract: Based on the result of image recognition of the first wafer, the scan area of image recognition in the second and later wafers is determined. For example, in an appearance inspection process of semiconductor pellets, the first wafer is scanned over for image recognition to determine a contour (hereinafter referred to as the polygon) of a set constituted by pellets excluding non-shaped pellets as the scan area for the second and later wafers. This allows for reducing the scan area for the second and later wafers, thereby eliminating unnecessary areas to scan and saving time and costs required for the work.